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Items where Subject is "Engineering Measurements > Dimensional"

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Report/Guide

Bailey, S L C; Lewis, A; Whiting, K; Lingard, M (2017) Care and use of gauge blocks. Measurement Good Practice Guide. 149

Bayliss, D J; Leach, R K; Hall, M J (2006) Development of an electromagnetic spring for use with a high accuracy surface texture measuring probe. NPL Report. DEPC-EM 006

Blunt, L*; Jiang, X*; Xiao, S*; Li, T*; Feng, X*; Brennan, J*; Scott, P*; Leach, R K; Harris, P M; Parkin, G I (2005) Development and dissemination of SOFTGAUGES for surface topography. Technical Report. Centre for Precision Technologies, University of Huddersfield.

Brice, L K W; Morris, S*; Motely, J*; Leach, R K (2008) Measurement of single and multi layer thin film coatings for medical implants. NPL Report. ENG 10

Burke, T*; Leach, R K; Boyd, R; Gee, M G; Roy, D; Yacoot, A; Ulrich-Danzebrink, H*; Dziomba, T*; Koenders, L*; Depero, L E*; Carneiro, K*; Dirschel, K*; Morazzani, V*; Lausmaa, J*; Pendrill, L*; Pidduck, A*; Roebben, G*; Sánchez, A*; Unger, W E S*; Proykova, A* (2011) European Nanometrology 2020. Technical Report. Co-Nanomet.

Chetwynd, D*; Howell, G*; Leach, R K (2002) Evaluation of the dynamic performance of a glass cantilever style constant force probe for the measurement of surface texture. NPL Report. CBTLM 23

Claverley, J D; Coupland, J M*; Leach, R K (2010) Measurement of the form and layer thickness of the target spheres for inertial confinement fusion. NPL Report. ENG 26

Claverley, J D; Leach, R K (2010) Investigation into the fixturing techniques used by the project partners in the EUMINAfab consortium. NPL Report. ENG 28

Corta, R*; Cox, M G; Cross, N R; Dotson, J R; Flack, D R; Forbes, A B; O'Donnell, J*; Peggs, G N; Prieto, E* (1998) A large reference artefact for CMM verification. NPL Report. CLM 6

Coveney, T (2014) Dimensional measurement using vision systems. Measurement Good Practice Guide. 39

Cox, M G; Cross, N R; Flack, D R; Forbes, A B; Peggs, G N (1997) Measurement of artefacts using repositioning methods. NPL Report. CLM 2

Cox, M G; Forbes, A B; Peggs, G N (1997) CMM verification and grading. NPL Report. CLM 1

Downes, S P (2001) Interim report on the fabrication and characterisation of the surface of silicon artefacts used in the Avogadro project. NPL Report. CMAM 64

Flack, D (2014) CMM measurement strategies. Measurement Good Practice Guide. 41

Flack, D (2014) CMM probing. Measurement Good Practice Guide. 43

Flack, D (2011) CMM verification. Measurement Good Practice Guide. 42

Flack, D (2014) Callipers and micrometers. Measurement Good Practice Guide. 40

Flack, D R (2013) Co-ordinate measuring machine task-specific measurement uncertainties. Measurement Good Practice Guide. 130

Flack, D R (2000) Small angle generator final traceability report. NPL Report. CBTLM 3

Flack, D R; Bevan, K* (2005) Fundamental good practice guide in the design and interpretation of engineering drawings for measurement processes. Measurement Good Practice Guide. 79

Flack, D R; Hannaford, J (2006) Fundamental good practice in dimensional metrology. Measurement Good Practice Guide. 80

Flay, N; Leach, R K (2012) Application of the optical transfer function in x-ray computed tomography - a review. NPL Report. ENG 41

Forbes, A B; Harris, P M; Leach, R K (2003) The comparison of algorithm for the assessment of Type A1 surface texture reference artefacts. NPL Report. CMSC 33/03

Foreman, M R; Giusca, C L; Leach, R K; Coupland, J M* (2012) Determination of the transfer function for optical surface topography measuring instruments. NPL Report. ENG 36

Giusca, C L; Evans, A A*; McDonald, D*; Leach, R K (2012) The effect of use duration on surface roughness measurements of stone tool. NPL Report. ENG 35

Giusca, C L; Leach, R K (2013) Calibration of the metrological characteristics of Coherence Scanning Interferometers (CSI) and Phase Shifting Interferometers (PSI). Measurement Good Practice Guide. 127

Giusca, C L; Leach, R K (2013) Calibration of the metrological characteristics of Imaging Confocal Microscopes (ICMs). Measurement Good Practice Guide. 128

Giusca, C L; Leach, R K (2013) Calibration of the metrological characteristics of contact stylus instruments. Measurement Good Practice Guide. 129

Giusca, C L; Smith, I M (2013) Areal lateral calibration software: user manual. NPL Report. ENG 45

Hansen, P-E*; Roebben, G*; Babick, F*; Boyd, R; Braun, A*; Busch, I*; Danzebrink, H-U*; Depero, L*; Dirscherl, K*; Dziomba, T*; Eriksson, E*; Franks, K*; Gee, M G; Jennett, N M; Kestens, V*; Koenders, L*; Krumrey, M*; Lausmaa, J*; Leach, R K; Pendrill, L*; Pidduck, A*; Put, S*; Roy, D; Stintz, M*; Turan, R*; Yacoot, A (2010) Introductory guide to nanometrology. Technical Report. European Commission.

Hart, A; Haycocks, J; Jackson, K; Law, A; Leach, R K (2002) Measurement of surface texture in CBTLM: a three-year review of instrument capabilities. NPL Report. CBTLM 21

Hart, A; Leach, R K (2001) Review of methods for cleaning surfaces prior to surface texture measurement as part of project LE9953, milestone 5.3.1.4. NPL Report. CBTLM 12

He, B*; Petzing, J*; Webb, P*; Conway, P*; Leach, R K (2012) The use of areal surface texture parameters to characterize the mechanical bond strength of copper on glass plating applications. NPL Report. ENG 34

Hughes, B; Forbes, A B; Nasr, K; Sun, W J; Veal, D (2011) Validation of the network method for determination of laser tracker alignment errors: NIMTech deliverable 3.7. NPL Report. ENG 30

Hughes, B; Forbes, A B; Sun, W J (2011) Good practice for deployment and use of iGPS/iSPACE: NIMTech deliverable 3.1(2). NPL Report. ENG 31

Hughes, B; Forbes, A B; Sun, W J (2011) Procedure for calibration of laser tracker alignment errors using a network measurement: NIMTech deliverable 3.1(1). NPL Report. ENG 29

Hughes, E B; Ferrucci, M; Forbes, A B (2015) Preliminary investigation into the use of a network-based technique for calibration of 3D laser scanners. NPL Report. ENG 59

Hughes, E B; Muelaner, J*; Martin, O* (2010) ViewNet reference network survey. NPL Report. ENG 22

Jones, C W; Leach, R K (2008) Review of low force transfer artefact technologies. NPL Report. ENG 5

Lancaster, A; Dury, M (2017) Measurement of the surface texture of large roller bearings. Measurement Good Practice Guide. 148

Law, A; Leach, R K (2001) Use of a polymer film bridge to measure the contact force applied by instruments used in the measurement of surface textures. NPL Report. CBTLM 14

Leach, R K (1999) Calibration, traceability and uncertainty issues in surface texture metrology. NPL Report. CLM 7

Leach, R K (2014) The measurement of surface texture using stylus instruments. Measurement Good Practice Guide. 37

Leach, R K (1995) A novel 3-axis CMM probe calibration facility. NPL Report. MOM 126

Leach, R K; Brown, L*; Jiang, X*; Blunt, R*; Conroy, M*; Mauger, D* (2008) Guide to the measurement of smooth surface topography using coherence scanning interferometry. Measurement Good Practice Guide. 108

Leach, R K; Cui, Z*; Flack, D R (2003) Microsystems technology standardisation roadmap. Technical Report. NPL, UK.

Leach, R K; Garbutt, I; Harris, P; Cox, M G (2001) Production, measurement and analysis of sinusoidal artefacts for calibration of surface texture measuring instruments. NPL Report. CBTLM 7

Leach, R K; Giusca, C (2009) Results from a comparison of optical thin film thickness measurement. NPL Report. ENG 18

Leach, R K; Hart, A (2001) Investigation into the shape of diamond styli used for surface texture measurement. NPL Report. CBTLM 10

Leach, R K; Hart, A (2002) A comparison of stylus and optical methods for measuring 2D surface textures. NPL Report. CBTLM 15

Leach, R K; Hart, A; Jackson, K (1999) Measurement of gauge blocks by interferometry: an investigation into the variability in wringing film thickness. NPL Report. CLM 3

Leach, R K; Jackson, K; Hart, A (1997) Design of two systems to measure the phase change at reflection and one system to measure the variability in contact error due to wringing. NPL Report. MOT 10

Leach, R K; Jackson, K; Hart, A (1997) Measurement of gauge blocks by interferometry: measurement of the phase change at reflection. NPL Report. MOT 11

Leach, R K; Murphy, J; Wilson, A (2004) Design of a co-ordinate measuring probing system for characterising three-dimensional micro-structures. NPL Report. CBTLM 30

Leach, R K; Oldfield, S; Awan, S A; Blackburn, J; Williams, J M (2004) Design of a bi-directional electrostatic actuator for realising nanonewton to micronewton forces. NPL Report. DEPC-EM 001

Lewis, A (2008) Uncertainty budget for the NPL-UCL swing arm profilometer operating in comparator mode. NPL Report. ENG 9

Li, T*; Leach, R K; Jiang, X*; Blunt, L A* (2009) Comparison of type F2 software measurement standards for surface texture. NPL Report. ENG 16

Marwaha, N; Bevan, K (2016) Strategic planning for coordinate metrology. Measurement Good Practice Guide. 138

Nimishakavi, L P; Giusca, C L; Leach, R K; Blanchon, B* (2012) The use of areal surface texture parameters for determining machining parameters in precision grinding. NPL Report. ENG 33

Parker, A (2000) Optical fibre coating thickness and geometry - report on a feasibility study of traceability issues associated with different measurement techniques. NPL Report. CBTLM 5

Petzing, J*; Coupland, J*; Leach, R K (2010) The measurement of rough surface topography using coherence scanning interferometry. Measurement Good Practice Guide. 116

Reilly, S P; Leach, R K (2006) Critical review of seismic vibration isolation techniques. NPL Report. DEPC-EM 007

Reilly, S P; Leach, R K; Cuenat, A; Awan, S A; Lowe, M (2006) Overview of MEMS sensors and the metrology requirements for their manufacture. NMS Programme for Engineering Measurement 2005-2008. NPL Report. DEPC-EM 008

Robinson, A D; Leach, R K (2008) Overview of tomography techniques to measure wafer thickness in MEMS structures. NPL Report. ENG 8

Rodger, G N; Flack, D R; McCarthy, M B (2007) A review of industrial capabilities to measure free-form surfaces. NPL Report. DEPC-EM 014

Smith, I M; Harris, P M (2011) Reference software for calculating areal surface texture parameters: User manual. NPL Report. MS 14

Sun, W; Brown, S B; Leach, R K (2012) An overview of industrial X-ray computed tomography. NPL Report. ENG 32

Sun, W; Giusca, C; Lancaster, A (2017) Surface texture measurements of gear surfaces using stylus instruments. Measurement Good Practice Guide. 147

Sun, W; Leach, R K (2010) Measurement of the internal geometry of MEMS structures. NPL Report. ENG 24

Virdee, M (1993) A new approach for establishing a reference plane for absolute measurement of shape and flatness with nanometre precision. NPL Report. MOM 114

Wang, J; Leach, R K; Jiang, X* (2014) Advances in sampling techniques for surface topography measurement - a review. NPL Report. ENG 55

Wang, J; Leach, R K; Jiang, X* (2014) Review of data fusion for surface topography measurement. NPL Report. ENG 54

Wilson, A; Leach, R K (2009) Manufacturing and testing of a micro-stylus suitable for tactile probing in dimensional metrology. NPL Report. ENG 15

Yacoot, A; Leach, R K (2007) Review of x-ray and optical thin film measurement methods and transfer artefacts. NPL Report. DEPC-EM 013

Article

Abir, J*; Longo, S*; Morantz, P*; Shore, P (2016) Optimized estimator for real-time dynamic displacement measurement using accelerometers. Mechatronics, 39. pp. 1-11.

Abir, J*; Longo, S*; Morantz, P*; Shore, P (2017) Virtual metrology frame technique for improving dynamic performance of a small size machine tool. Precision Eng., 48. pp. 24-31.

Abir, J*; Morantz, P*; Longo, S*; Shore, P (2016) A novel accelerometer based feedback concept for improving machine dynamic performance. IFAC - Papers Online, 49 (21). pp. 553-558.

Acko, B*; McCarthy, M; Haertig, F*; Buchmeister, B* (2012) Standards for testing freeform measurement capability of optical and tactile co-ordinate measuring machines. Meas. Sci. Technol., 23 (9). 094013

Ametova, E; Ferrucci, M; Chilingaryan, S; Dewulf, W (2018) A computationally inexpensive model for estimating dimensional measurement uncertainty due to x-ray computed tomography instrumentation misalignments. Measurement Science and Technology, 29 (6). 065007

Austin, R S*; Giusca, C L; Macaulay, G; Moazzez, R*; Bartlett, D W* (2016) Confocal laser scanning microscopy and area-scale analysis used to quantify enamel surface textural changes from citric acid demineralisation and salivary remineralisation in vitro. Dental Materials, 32 (2). pp. 278-284.

Bakucz, P*; Yacoot, A; Dziomba, T*; Krüger-Sehm, R* (2008) Neural network approximation of tip-abrasion effects in AFM-imaging. Meas. Sci. Technol., 19 (6). 065101

Barnett, M E*; Turner, N P (1993) Phase information in the coherent imaging of abrupt edges. Opt. Commun., 96. pp. 27-35.

Barwood, G P; Gill, P; Rowley, W R C (1993) Laser diodes for length determination using swept-frequency interferometry. Meas. Sci. Technol., 4 (9). pp. 988-994.

Basile, G*; Becker, P*; Bergamin, A*; Cavagnero, G*; Franks, A; Jackson, K; Kuetgens, U*; Mana, G*; Palmer, E W; Robbie, C J; Stedman, M; Stumpel, J*; Yacoot, A; Zosi, G* (2000) Combined optical and x-ray interferometry for high precision dimensional metrology. Proc. R. Soc. Lond. A, 456. pp. 701-729.

Bausi, F; Koutsourakis, G; Blakesley, J C; Castro, F A (2019) High-speed digital light source photocurrent mapping system. Measurement Science and Technology, 30 (9). 095902 ISSN 0957-0233

Birch, K P; Reinboth, F*; Ward, R E; Wilkening, G* (1993) The effect of variations in the refractive index of industrial air upon the uncertainty of precision length measurement. Metrologia, 30 (1). pp. 7-14.

Blunt, L*; Xiang Jiang*,, ; Leach, R K; Harris, P M; Scott, P* (2008) The development of user-friendly software measurement standards for surface topography software assessment. Wear, 264 (5-6). pp. 389-393.

Bosse, H; Kunzmann, H; Pratt, J R; Schlamminger, S; Robinson, I; de Podesta, M; Shore, P; Balsamo, A; Morantz, P (2017) Contributions of precision engineering to the revision of the SI. CIRP Annals - Manufacturing Technology, 66 (2). pp. 827-850.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Approximation of surface texture profiles. J. Phys., Conf. Ser., 13. pp. 264-267.

Brown, S; Stevens, R; Williams, D; McCarthy, M (2017) Colour imperfections in structured light projection for freeform measurement - a rapid test. Imaging Science Journal, 65 (5). pp. 293-298.

Burt, D P*; Dobson, P S*; Docherty, K E*; Jones, C W; Leach, R K; Thoms, S*; Weaver, J M R*; Zhang, Y* (2012) Aperiodic interferometer for six degrees of freedom position measurement. Opt. Lett., 37 (7). pp. 1247-1249.

Butler, B P; Music, V; Redgrave, F J (1999) Influence of orifice geometry on the simplification of transmission probability calculations. Vacuum, 53 (1-2). pp. 163-166.

Callender, M J*; Efstathiou, A*; King, C W*; Walker, D D*; Gee, A E*; Lewis, A J; Oldfield, S; Steel, R M (2006) A swing arm profilometer for large telescope mirror element metrology. Proc. SPIE - Int. Soc. Opt. Eng., 6273. 62732R

Celik, M*; Hamid, R*; Kuetgens, U*; Yacoot, A (2012) Picometre displacements measurements using a differential Fabry-Perot optical Interferometer and an x-ray interferometer. Meas. Sci. Technol., 23 (8). 085901

Claverley, J D; Leach, R K (2013) Development of a three-dimensional vibrating tactile probe for miniature CMMs. Precision Eng., 37 (2). pp. 491-499.

Claverley, J D; Leach, R K (2015) A review of the existing performance verification infrastructure for micro-CMMs. Precision Eng., 39. pp. 1-15.

Claverley, J D; Leach, R K (2010) A vibrating micro-scale CMM probe for measuring high aspect ratio structures. Microsyst. Technol., 16 (8-9). pp. 1507-1512.

Corbett, A D; Shaw, M; Yacoot, A; Jefferson, A; Schermelleh, L; Wilson, T; Booth, M; Salter, P S (2018) Microscope calibration using laser written fluorescence. Optics Express, 26 (17). pp. 21887-21899. ISSN 1094-4087

Corcoran, H C; Brown, S B; Robson, S*; Speller, R D*; McCarthy, M B (2016) Observations on the performance of X-ray computed tomography for dimensional metrology. International Archives of the Photogrammetry Remote Sensing and Spatial Information Sciences, 41 (B5). pp. 25-31.

Coupland, J M*; Mandal, R*; Palodhi, K*; Leach, R K (2013) Coherence scanning interferometry: linear theory of surface measurement. Appl. Opt., 52 (16). pp. 3662-3670.

Dale, J*; Hughes, E B; Lancaster, A J*; Lewis, A J; Reichold, A J H*; Warden, M S (2014) Multi-channel absolute distance measurement system with sub ppm-accuracy and 20 m range using frequency scanning interferometry and gas absorption cells. Opt. Express, 22 (20). pp. 24869-24893.

Decker, J E*; Lewis, A J; Cox, M G; Steele, A G*; Douglas, R J* (2010) A recommended method for evaluation of international comparison results. Measurement, 43 (6). pp. 852-856.

Downs, M J (1998) Realisation of the optimum performance from length-measuring interferometers by atmospheric refractometry. Proc. SPIE - Int. Soc. Opt. Eng., 3477. pp. 46-53.

Doytchinov, I; Tonnellier, X; Shore, P; Nicquevert, B; Modena, M; Mainaud Durand, H (2018) Application of probabilistic modelling for the uncertainty evaluation of alignment measurements of large accelerator magnets assemblies. Measurement Science and Technology, 29 (5). 054001 ISSN 0957-0233

Eichstadt, S*; Wilkens, V*; Dienstfrey, A*; Hale, P*; Hughes, B; Jarvis, C* (2016) On challenges in the uncertainty evaluation for time-dependent measurements. Metrologia, 53 (4). S125-S135

Evans, A A*; Macdonald, D A*; Giusca, C L; Leach, R K (2014) New method development in prehistoric stone tool research: evaluating use duration and data analysis protocols. Micron, 65. pp. 69-75.

Ferrucci, M; Ametova, E*; Carmignato, S*; DeWulf, W* (2016) Evaluating the effects of detector angular misalignments on simulated computed tomography data. Precision Eng., 45. pp. 230-241.

Ferrucci, M; Heřmánek, P; Ametova, E; Carmignato, S; Dewulf, W (2018) Measurement of the X-ray computed tomography instrument geometry by minimization of reprojection errors—Implementation on simulated data. Precision Engineering, 54. pp. 7-20. ISSN 01416359

Ferrucci, M; Leach, R K; Giusca, C L; Carmignato, S*; Dewulf, W* (2015) Towards geometrical calibration of X-ray computed tomography systems - a review. Meas. Sci. Technol., 26 (9). 092003

Fiala, P; Gohler, D; Wessely, B; Stintz, M; Lazzerini, G M; Yacoot, A (2017) Evaluation of preparation methods for suspended nano objects on substrates for dimensional measurements by atomic force microscopy. Beilstein Journal of Nanotechnology, 8. pp. 1774-1785.

Forbes, A B (2012) Weighting observations from multi-sensor coordinate measuring systems. Meas. Sci. Technol., 23 (2). 025004

Foreman, M R; Giusca, C L; Coupland, J M*; Török, P*; Leach, R K (2013) Determination of the transfer function for optical surface topography measuring instruments - a review. Meas. Sci. Technol., 24 (5). 052001

Foreman, M R; Giusca, C L; Torok, P*; Leach, R K (2013) Phase-retrieved pupil function and coherent transfer function in confocal microscopy. J. Microsc., 251 (1). pp. 99-107.

Franks, A; Jackson, K; Yacoot, A (2000) A parabolic mirror x-ray collimator. Meas. Sci. Technol., 11. pp. 484-488.

Franks, A; Luty, M; Robbie, C J; Stedman, M (1998) A design study of a microthrust balance for space applications. Nanotechnology, 9 (2). pp. 61-66.

Geckeler, R D; Just, A; Vasilev, V; Prieto, E; Dvorácek, F; Zelenika, S; Przybylska, J; Duta, A; Victorov, I; Pisani, M; Saraiva, F; Salgado, J A; Gao, S; Anusorn, T; Tan, S L; Cox, P; Watanabe, T; Lewis, A; Chaudhary, K P; Thalmann, R; Banreti, E; Nurul, A; Fira, R; Yandayan, T; Chekirda, K; Bergmans, R; Lassila, A (2018) Angle comparison using an autocollimator. Metrologia, 55 (1A). 04001 ISSN 0026-1394

Geo, F*; Leach, R K; Petzing, J*; Coupland, J M* (2008) Surface measurement errors using commercial scanning white light interferometers. Meas. Sci. Technol., 19 (1). 015303

Giusca, C L; Claverley, J D; Sun, W J; Leach, R K; Helmli, F*; Chavigner, M P J* (2014) Practical estimation of measurement noise and flatness deviation on focus variation microscopes. CIRP Ann. - Manuf. Technol., 63 (1). pp. 545-548.

Giusca, C L; Leach, R K (2013) Calibration of the scales of areal surface topography measuring instruments: Part 3 Resolution. Meas. Sci. Technol., 24 (10). 105010

Giusca, C L; Leach, R K; Forbes, A B (2011) A virtual machine-based uncertainty evaluation for a traceable areal surface texture measuring instrument. Measurement, 44 (5). pp. 988-993.

Giusca, C L; Leach, R K; Helery, F* (2012) Calibration of the scales of areal surface topography measuring instruments: Part 2 Amplification, linearity and squarness. Meas. Sci. Technol., 23 (6). 065005

Giusca, C L; Leach, R K; Helery, F*; Gutauskas, T* (2011) Calibration of the geometrical characteristics of areal surface topography measuring instruments. J. Phys., Conf. Ser., 311. 012005

Giusca, C L; Leach, R K; Helery, F*; Gutauskas, T*; Nimishakavi, L (2012) Calibration of the scales of areal surface topography measuring instruments: Part 1 Measurement noise and residual flatness. Meas. Sci. Technol., 23 (3). 035008

Godden, T M*; Muniz-Piniella, A; Claverley, J D; Yacoot, A; Humphry, M J* (2016) A phase calibration target for quantitative phase imaging with ptychography. Opt. Express, 24 (7). pp. 7679-7692.

Hall, S R G; Cashmore, M T; Blackburn, J; Koutsourakis, G*; Gottschalg, R* (2016) Compressive current response mapping of photovoltaic devices using MEMS mirror arrays. IEEE Trans. Instrum. Meas., 65 (8). pp. 1945-1950.

Harris, P M; Smith, I M; Leach, R K; Giusca, C; Jiang, X*; Scott, P* (2012) Software measurement standards for areal surface texture parameters: Part I - algorithms. Meas. Sci. Technol., 23 (10). 105008

Harris, P M; Smith, I M; Wang, C*; Giusca, C; Leach, R K (2012) Software measurement standards for areal surface texture parameters: Part II - comparison of software. Meas. Sci. Technol., 23 (10). 105009

Haycocks, J (2005) Surface certainty (3D surface measurement). Metalwork. Prod., 149 (7). p. 31.

Haycocks, J; Jackson, K (2005) Traceable calibration of transfer standards for scanning probe microscopy. Precision Engineering, 29. pp. 168-175.

Henning, A J; Giusca, C; Forbes, A B; Smith, I; Leach, R K; Coupland, J*; Mandal, R* (2013) Correction for lateral distortion in coherence scanning interferometry. CIRP Ann. - Manuf. Technol., 62. pp. 547-550.

Henning, A J; Giusca, C L (2017) Considerations on the proposed linear theory of surface measurement for coherence scanning interferometers. Appl. Opt., 56 (10). pp. 2960-2967.

Henning, A J; Giusca, C L (2015) Errors and uncertainty in the topography gained via frequency-domain analysis. Opt. Express, 23 (18). pp. 24057-24070.

Henning, A J; Huntley, J M*; Giusca, C L (2015) Obtaining the transfer function of optical instruments using large calibrated reference objects. Opt. Express, 23 (13). pp. 16617-16627.

Hughes, B; Campbell, M A; Lewis, A J; Lazzerini, G M; Kay, N (2017) Development of a high-accuracy multi-sensor, multi-target coordinate metrology system using frequency scanning interferometry and multilateration. Proceedings of SPIE, 10332. 1033202

Hughes, E B; Forbes, A B; Lewis, A; Sun, W; Veal, D; Nasr, K (2011) Laser tracker error determination using a network measurement. Meas. Sci. Technol., 22 (4). 045103

Hughes, E B; Sun, W; Forbes, A B; Lewis, A (2010) Determining laser tracker alignment errors using a network measurement. J. CMSC, 5 (2). pp. 26-32.

Jones, C W; Leach, R K (2008) Adding a dynamic aspect to amplitude-wavelength space. Meas. Sci. Technol., 19 (5). 055105

Jones, C W; O'Connor, D (2018) A hybrid 2D/3D inspection concept with smart routing optimisation for high throughput, high dynamic range and traceable critical dimension metrology. Measurement Science and Technology, 29 (7). 074004

Joung, W; Park, J; Pearce, J V (2018) Determination of the liquidus temperature of tin using the heat pulse-based melting and comparison with traditional methods. Metrologia, 55 (3). pp. 334-349.

Jusko, O*; Bosse, H*; Flack, D; Hemming, B*; Pisani, M*; Thalmann, R* (2012) A comparison of sensitivity standards in form metrology - final results of the EURAMET project 649. Meas. Sci. Technol., 23 (5). 054006

Klapetek, P*; Nacas, D*; Campbellova, A*; Yacoot, A; Koenders, L* (2011) Methods for determining and processing 3D errors and uncertainties for AFM data analysis. Meas. Sci. Technol., 22 (2). 025501

Klapetek, P*; Picco, L*; Payton, O*; Yacoot, A; Miles, M* (2013) Error mapping of high-speed AFM systems. Meas. Sci. Technol., 24 (2). 025006

Klapetek, P*; Valtr, M*; Picco, L*; Payton, O D*; Martinek, J*; Yacoot, A; Miles, M* (2015) Large area high-speed metrology SPM system. Nanotechnology, 26 (6). 065501

Lazzerini, G M; Paterno, G M*; Tregnago, G*; Treat, N*; Stingelin, N*; Yacoot, A; Cacialli, F* (2016) Traceable atomic force microscopy of high-quality solvent-free crystals of [6,6]-phenyl-C 61-butyric acid methyl ester. Appl. Phys. Lett., 108 (5). 053303

Leach, R K (2010) Engineering the surface to affect its function. Measurement and Control, 43 (9). pp. 278-279.

Leach, R K (1998) Measurement of a correction for the phase change on reflection due to surface roughness. Proc. SPIE - Int. Soc. Opt. Eng., 3477. pp. 138-151.

Leach, R K (2008) Metrology for micro- and nanotechnology: some perspectives on requirements. Micro Manufacturing, 08 (08). pp. 18-21.

Leach, R K (2009) Metrology for nanotechnology. Qual. Manufact. Today (Septem). pp. 28-29.

Leach, R K (2002) Miniature machine plugs metrology gap. Phys. World, 15 (6). pp. 27-28.

Leach, R K (2004) Some issues of traceability in the field of surface topography measurement. Wear, 257. pp. 1246-1249.

Leach, R K (2002) Surface texture - stylus v optical? Qual. Today (Januar). S18-S20

Leach, R K (2004) Surface texture metrology: more than just skin deep. Eng. Technol. (March). pp. 42-43.

Leach, R K (2000) Telling the rough from the smooth. Mater. World (Februa). pp. 18-19.

Leach, R K (2013) Thinking outside the Bento Box: NPL develops a new set of calibration artefacts for areal surface topography measurement. Qual. Manufact. Today (Nov/De). pp. 20-23.

Leach, R K (2002) Traceable measurements of surface texture in the optics industry. Proc. SPIE - Int. Soc. Opt. Eng., 4411. pp. 177-183.

Leach, R K (2009) The measurement and characterisation of three dimensional surface texture - a bright future for advanced manufacturing. Qual. Manufact. Today (Jan - ). pp. 37-38.

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Conference or Workshop Item

Basile, G*; Becker, P*; Bergamin, A*; Cavagnero, G*; Franks, A; Jackson, K; Kuetgens, U*; Mana, G*; Palmer, E W; Robbie, C J; Stedman, M; Stumpel, J*; Yacoot, A; Zosi, G* (1993) COXI - Combined optical and x-ray interferometry for high precision dimensional metrology. In: 7th International Precision Engineering Seminar, May 1993, Kobe, Japan.

Blunt, L*; Jiang, X*; Leach, R K; Harris, P M; Scott, P* (2005) The development of user-friendly software measurement standards for surface topography software assessment. In: Proceedings 10th International Conference on Metrology and Properties of Engineering Surfaces, 4-7 July 2005, St Ettiane, France.

Blunt, L*; Leach, R K; Jiang, X*; Scott, P*; Harris, P M; Xiao, S*; Li, T*; Parkin, G I (2005) Development of softgauges for surface metrology. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Reconstruction of continuous surface profiles from discretely sampled data. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Brennan, J K*; Mason, J C*; Jiang, X*; Leach, R K; Harris, P M (2004) Approximation of surface texture profiles and parameters. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Brice, L K W; Morris, S*; Motely, J*; Leach, R K (2008) Measurement of single and multi layer thin film coatings for medical implants. In: euspen 2008, 18-22 May 2008, Zurich.

Callendar, M J*; Efstathiou, A*; King, C W*; Walker, D D*; Gee, A E*; Lewis, A J; Oldfield, S; Steel, R M (2006) A 1m swing arm profilometer for large telescope mirror element. In: Proc. ASPE 2006 Annual Meeting, October 2006, Moterey, CA, USA.

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Chetwynd, D G*; Leach, R K (2002) Dynamic performance of a cantilever-based topography. In: 3rd Internation Conference of the European Society for Precision Engineering and Nanotechnology (euspen), 26-30 May 2002, Eindhoven, The Netherlands.

Claverley, J D; Burisch, A*; Leach, R K; Raatz, A* (2012) Semi-automated assembly of a MEMS-based micro-scale CMM probe and future optimization of the process chain with a view to desktop factory automation. In: Precision Assembly Technologies and Systems 6th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2012,, 12-14 February 2012, Chamonix, France.

Claverley, J D; Georgi, A*; Leach, R K (2010) Modelling the interaction forces between an ideal measurement surface and the stylus tip of a novel vibrating micro-scale CMM probe. In: 5th International Precision Assembly Seminar (IPAS 2010), February 2010, Chamonix, France.

Claverley, J D; Leach, R K (2010) Micro-scale co-ordinate metrology at the National Physical Laboratory. In: 36th International MATADOR Conference, 14 - 16 July 2010, Manchester, UK.

Claverley, J D; Leach, R K (2013) Three-dimensional characterisation of a novel vibrating tactile probe for miniature CMMs. In: Laser Metrology and Machine Performance X (LAMDAMAP 2013), 20-21 March 2013, Chicheley, UK.

Claverley, J D; Leach, R K (2010) A novel three-axis vibrating micro-CMM probe with isotropic probing forces. In: Proceedings of the 10th International Conference of the European Society for Precision Engineering & Nanotechnology (euspen), 31 May - 4 June 2010, Delft, Netherlands.

Claverley, J D; Sheu, D-Y*; Burisch, A*; Leach, R K; Raatz, A* (2011) Assembly of a novel MEMS-based 3D vibrating micro-scale co-ordinate measuring machine probe using desktop factory automation. In: IEEE International Symposium on Assembly and Manufacturing (ISAM) 2011, 25-27 May 2011.

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Decker, J E*; Lewis, A J; Cox, M G; Steele, A G*; Douglas, R J* (2006) Evaluating results of international comparisons: worked example of CCL-K2 comparison of long gauge block calibration. In: IMEKO World Congress 2006, September 2006, Rio de Janeiro.

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Gao, F*; Petzing, J N*; Coupland, J M*; Leach, R K (2007) Measurement of structured surfaces using stylus AFM and optical methods. In: 7th International Conference and 9th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 17-20 July 2007, Huddersfield, UK.

Giusca, C L; Forbes, A B; Leach, R K (2009) Comparison between GUM, Monte Carlo and bayesian uncertainty evaluation approaches for an areal surface texture measuring instrument. In: 14th International Congress of Metrology, 22-25 June 2009, Paris.

Giusca, C L; Forbes, A B; Leach, R K (2009) Uncertainty evaluation for a new traceable areal surface texture measuring instrument. In: 12th International Conference on Metrology and Properties of Engineering Surfaces, 8-10 July 2009, Rzeszów, Poland.

Giusca, C L; Leach, R K; Helery, F*; Gutauskas, T* (2011) Calibration of the geometrical characteristics of areal surface texture measuring instruments. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Haycocks, J; Jackson, K; Leach, R K; Garratt, J*; McDonnell, I*; Rubert, P*; Lamb, J*; Wheeler, S* (2005) Tackling the challenge of traceable surface texture measurement in three dimensions. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Haycocks, J; Jackson, K; Robbie, C J; Stedman, M (1997) Traceable metrology for scanning probe microscopes. In: Proc. 2nd Seminar on Quantitive Microscopy, November 1997, PTB, Germany.

He, B*; Petzing, J N*; Webb, D P*; Conway, P P*; Leach, R K (2012) The assessment of areal surface texture parameters for characterizing the adhesive bond strength of copper plated micro-machined glass. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

He, B*; Webb, D P*; Petzing, J*; Leach, R K (2011) Improving plated copper adhesion for metallisation of glass PCBs. In: International Conference on Electronic Packaging Technology and High Density packageing 2011 (ICEPT-HDP2011), 8-11 August 2011, Shanghai, China.

Hiersemenzel, F*; Petzing, J N*; Leach, R K; Helmli, F S*; Singh, J* (2012) Areal texture and angle measurement of tilted surface using focus variation methods. In: International Conference on Surface Metrology (ICSM'2012), 21-23 March 2012, Annecy, France.

Hiersemenzel, F*; Singh, J*; Petzing, J N*; Claverley, J D; Leach, R K; Helmli, F* (2013) Development of a traceable performance verification route for optical micro-CMMs. In: Laser Metrology and Machine Performance X (LAMDAMAP 2013), 20-21 March 2013, Chichley, UK.

Hiersemenzel. F*,, ; Claverley, J D; Singh, J*; Petzing, J N*; Helmli, F*; Leach, R K (2013) ISO compliant reference artefacts for the verification of focus variation-based optical micro-coordinate measuring machines. In: Proceedings of the 13th euspen International Conference, 27-31 May 2013, Berlin, Germany.

Hiersmenzel, F*; Singh, J*; Petzing, J N*; Leach, R K; Helmli, F*; Danzl, R* (2012) The assessment of residual flatness errors in focus variation areal measuring instruments. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Hughes, E B; Oldfield, S (2004) Thrust balance for ground testing of electric thrusters. In: 4th euspen International Conference, May 2004, Glasgow, UK.

Jones, C W; Chetwynd, D*; Singh, J*; Leach, R K (2011) Concept and modelling of a novel active triskelion low force transfer artefact. In: 11th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Jones, C W; Davidson, S; Kramer, J A*; Leach, R K; Pratt, J R* (2008) Comparison of NIST SI force scale to NPL SI mass scale. In: ASPE 2008 Annual Meeting, 19-24 October 2008, Portland, Oregon.

Jones, C W; Leach, R K (2008) Amplitude-wavelength space in three dimensions. In: 12th International Colloquium on Surfaces, 28-29 January 2008, Chemnitz, Germany.

Kautt, M*; Anson, S M*; Saile, V*; Scholz, S*; Fugier, P*; Lambertini, V*; Abad, E*; Dirne, F*; Loeschner, H*; Leach, R K (2009) Facilitating open innovation in micro and nano technology by providing open access to a pan-European toolbox called EUMINAfab. In: 4M/ICOMM 2009 Conference, 23-25 September 2009, Forschungszentrum Karlruhe, Germany.

Leach, R K (2001) Current problems in the field of surface texture measurement. In: National Measurement Conference (NMC) 2001, 6-8 November 2001, Harrogate, UK.

Leach, R K (2004) Some issues of traceability in the field of surface topography measurement. In: Proceedings of the 9th International Conference on Metrology and Properties of Engineering Surfaces, April 2004, Sweden.

Leach, R K (2002) The importance of metrology and standardisation for micro-systems technology. In: 7th International Conference on Commercialisation of Micro and Nano Systems, 8-12 September 2002, Michigan, USA.

Leach, R K (2001) A recent comparison of stylus and optical methods for measuring surface texture. In: 9th IMEKO Symposium Metrology for Quality Control in Production; Surface Metrology for Quality Assurance., 24-27 September 2001, Cairo, Egypt.

Leach, R K; Bennett, I* (2004) Characterisation of a new vertical scanning white light interferometer - a test case? In: 11th International Colloquium on Surfaces, 2-3 February 2004, Chemnitz, Germany.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2001) The need for a metrology infrastructure to support nanotechnology. In: Proceedings of the 5th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII), 25-29 September 2001, Cairo, Egypt.

Leach, R K; Coupland, J*; Mandal, R*; Giusca, C; Foreman, M* (2012) Calibration of areal surface topography measuring instruments: are we there yet? In: 27th Annual Meeting of the American Society for Precision Engineering., 21-26 October 2012, San Diego, CA, USA.

Leach, R K; Flack, D R; Hughes, E B; Jones, C W (2007) Development of a new traceable areal surface texture measuring instrument. In: 11th International Conference on Metrology & Properties of Engineering Surfaces., 17-20 July 2007, Huddersfield, UK.

Leach, R K; Garbutt, I; Cox, M G (2001) Sinusoidally modulated reference artefacts for calibration of surface texture measuring instruments. In: Proceedings of 2nd European Society for Precision Engineering and Nanotechnology (Euspen) International Conference, 27-31 May 2001, Turin, Italy.

Leach, R K; Giusca, C (2008) Traceable measurement of areal surface texture. In: Proceedings of the 4th International Conference on Multi-Material Micro Manufacture (4M 2008), 9-11 September 2008, Cardiff, UK.

Leach, R K; Giusca, C; Naoi, K* (2009) Traceability for areal surface texture measurement. In: 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), 29 June - 2 July 2009, Saint-Petersburg, Russia.

Leach, R K; Giusca, C L; Rubert, P* (2013) A single set of material measures for the calibration of areal surface topography measuring instruments: the NPL Areal Bento Box. In: Metrology and Properties of Engineering Surfaces, 2013: Proceedings of the 14th International Conference (14th MPES), 17-21 June 2013, Taipei, Taiwan.

Leach, R K; Giusca, C*; Naoi, K* (2009) A traceability infrastructure for three-dimensional surface measurements at the National Physical Laboratory. In: Proceedings of the 9th euspen International Conference, 2-5 June 2009, San Sebastian, Spain.

Leach, R K; Harris, P M; Smith, I; Giusca, C L; Jiang, X*; Scott, P* (2013) Software measurement standards for areal surface texture parameters. In: Metrology and Properties of Engineering Surfaces, 2013: Proceedings of the 14th International Conference (14th MPES)., 17-21 June 2013, Taipei, Taiwan.

Leach, R K; Jones, C W; Sherlock, B; Krysinski, A* (2013) Metrology challenges for highly parallel micro-manufacture. In: 4M 2013 - Proceedings of the 10th International Conference on Multi-Material Micro Manufacture., 8-10 October 2013, San Sebastian, Spain.

Leach, R K; Jones, C W; Sherlock, B; Krysinski, A* (2013) The high dynamic range surface metrology challenge. In: 28th Annual Meeting of the American Society for Precision Engineering., 20-25 October 2013, St. Paul, Minnesota, USA.

Leach, R K; Lewis, A; Singleton, L*; Cui, Z* (2003) Towards a standardisation roadmap for micro-systems technology: review of the MEMSTAND survey. In: Proceedings of euspen "Transferring Micro-systems Technology though the Commercial Markets"., 14-15 April 2003, NPL,UK.

Leach, R K; Li, T*; Jiang, X*; Blunt, L*; Giusca, C (2010) Comparison of commercial software packages for calculating surface texture parameters. In: 10th International Conference of the European Society for Precision Engineering & Nanotechnology (euspen), 31 May - 4 June 2010, Delft, Netherlands.

Leach, R K; Murphy, J (2004) The design of co-ordinate measuring probe for characterising truly three-dimensional micro-structures. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Lee-Bennett, I*; Leach, R K (2004) Metrology for microsystems - characterisation of a new broadband interferometer. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Lewis, A; Oldfield, S; Callender, M*; Efstathiou, A*; Gee, A*; King, C*; Walker, D* (2006) Arcuate arm profilometry - traceable metrology for large mirrors. In: Symposium of Metrology 2006, 25-27 October 2006, Mexico.

Lobera, J*; Gao, F*; Coupland, J*; Leach, R K (2008) Limitations and innovations in scanning white light interferometry. In: euspen 2008, 18-22 May 2008, Zurich.

Mandal, R*; Palodhi, K*; Coupland, J*; Leach, R K; Mansfields, D* (2011) Measurement of the point spread function in coherence scanning interferometry. In: Proceedings of the International Conference on Trends in Optics and Photonics II, 7-9 December 2011, Kolkata, India.

McCarthy, M B; Nunn, J W; Rodger, G N (1997) NPL optical length scales in the range 300nm to 400nm. In: Proc. Landamap 97, 16 July 1997, Huddersfield.

McKee, C*; Culshaw, B*; Leach, R K (2012) Thickness measurement of silicon MEMS pressure sensor membrane using laser generated ultrasound. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Meyer, P*; Claverley, J D; Kaiser, K*; Mohr, J*; Leach, R K (2011) Comparison of dimensional measurements of microparts made using deep x-ray lithography (LIGA): first results. In: 11th International Conference of the European Society for Prescision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Nasr, K M; Hughes, B; Forbes, A B; Lewis, A (2014) Determination of laser tracker angle encoder errors. In: UNSPECIFIED.

Nimishakavi, L P; Giusca, C L; Leach, R K; Blanchon, B* (2012) Measurement and characterization of the areal surface texture of crankshafts for optimizing the process variables during manufacture. In: International Conference on Surface Metrology (ICSM'2012), 21-23 March 2012, Annecy, France.

Palodhi, K*; Coupland, J M*; Leach, R K (2011) Determination of the point spread function of a coherence scanning interferometer. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Palodhi, K*; Coupland, J M*; Leach, R K (2011) Measurement of complex refractive index using microellipsometry and its relevance to surface measurement using coherence scanning interferometry. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Palodhi, K*; Coupland, J*; Leach, R K (2011) Absolute surface topography measurement of composite structures using coherence scanning interferometry. In: 11th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Peggs, G N; Lewis, A; Leach, R K (2003) Measuring in three dimensions at the mesoscopic level. In: Proceedings of the ASPE Winter Topical Meeting - Machines and Processes for Micro-scale and Meso-scale Fabrication, Metrology and Assembly., January 2003, Florida, USA.

Rajaguru, P*; Stoyanov, S*; Tang, Y K*; Bailey, C*; Claverley, J; Leach, R K; Topham, D* (2010) Numerical modelling methodology for design of miniaturised integrated products - an application to 3D CMM micro-probe development. In: 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiements in Microelectronics and Microsystems (EuroSimE 2010)., 26-28 April 2010, Bordeaux, France.

Singleton, L*; Leach, R K; Cui, Z* (2003) Analysis of the MEMSTAND survey on standardisation for microsystems technology. In: Proceedings of the International Seminar MEMSTAND - "Standardisation for Microsystems: the Way Forward"., 24-26 February 2003, Barcelona, Spain.

Smale, D*; Haley, S*; Segal, J*; Ronaldo, R*; Ratchev, S*; Leach, R K; Claverley, J D (2010) Utilisation of FIB/SEM technology in the assembly of an innovative micro-CMM probe. In: 5th International Precision Assembly Seminar (IPAS 2010), February 2010, Chamonix, France.

Smale, D*; Ratchev, S*; Segal, J*; Leach, R K; Claverley, J D (2009) Assembly of the stem and tip of an innovative micro-CMM probe. In: 9th International Conference and Exhibition on Laser Meterology, Machine Tool, CMM and Robotic Performance (LAMDAMAP 2009), 2009.

Stedman, M; Franks, A (1995) The UK national surface texture measuring facility. In: 125th International Seminar on Quantitative Microscopy, October 1995, Brunswick, Germany.

Stedman, M; Franks, A; Luty, M (1996) Measurement of the microthrust of the field emission electric propulsion unit. In: Proc. 2nd European spacecraft propulsion conference, 1996.

Stoyanov, S*; Bailey, C*; Leach, R K; Hughes, B; Wilson, A; O'Neill, W*; Dorey, R A*; Shaw, C*; Underhill, D*; Almond, H J* (2008) Modelling and prototyping the conceptual design of 3D CMM micro-probe. In: 2nd Electronics Systemintegration Technology Conference, 2008, Greenwich, UK.

Stoyanov, S*; Rajagura, P*; Tang, Y K*; Bailey, C*; Claverley, J; Leach, R K (2010) Reduced order modelling for risk mitigation in design of miniaturised/integrated products. In: 33rd International Spring Seminar on Electronics Technology, 12-16 May 2010, Warsaw, Poland.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2011) Efficiency of adaptive sampling in surface texture measurement for structured surfaces. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) A boundary segmentation algorithm for extracting micro-scale dimensional parameters in the measurement of structured surfaces. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Book Chapter/Section

Forbes, A B; Peggs, G N (1997) A large reference artefact for CMM verification. In: Laser Metrology and Machine performance III. UNSPECIFIED, pp. 393-400.

Leach, R K; Giusca, C L; Henning, A; Sherlock, B; Coupland, J* (2014) ISO definition of resolution for surface topography measuring instruments. In: Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology. Springer, pp. 405-410. ISBN 9783642363580

This list was generated on Sat Dec 14 20:09:41 2019 GMT.