< back to main site


Review of low force transfer artefact technologies.

Jones, C W; Leach, R K (2008) Review of low force transfer artefact technologies. NPL Report. ENG 5

[img] Text

Download (3MB)


Traceable low force measurement at the micro- to nanonewton level is becoming critical to advances in nanoscale research and manufacturing. Previous attempts at low force traceability and other candidate technologies are reviewed in this report. Technologies determined to be unsuitable for immediate or further exploitation include protein manipulation and those based on quantum intermolecular forces, capillary forces and radiation pressure. Technologies highlighted for further development contain an elastic element with active displacement metrology based on the piezoelectric effect, capacitance gauges, volt balances and resonant frequency shifts. All would benefit from onboard signal processing. This report will inform the design of a complete low force calibration transfer system from the NPL Low Force Balance to most typical and many atypical force producers requiring calibration.

Item Type: Report/Guide (NPL Report)
NPL Report No.: ENG 5
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4119

Actions (login required)

View Item View Item