Pfeifer, T; Montavon, B; Peterek, M; Hughes, B (2019) Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems. CIRP Annals, 68 (1). pp. 503-506. ISSN 00078506

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Abstract

Recent metrology-based manufacturing paradigms impose requirements to Large-Scale Metrology systems that can be realised overcoming individual limitations using multi-sensor architectures. Competitive and cooperative data fusion presuppose measurement systems with different incompatible targets having aligned coordinate systems. This paper presents a registration method neither probing common features nor requiring calibrated artifacts but using an uncalibrated bar equipped with two targets at fixed locations moving on a random trajectory. The underlying mathematical model allows calculating transformation parameters including analytical propagation of statistical uncertainties. Method and model are successfully validated by Monte-Carlo simulations along with experiments using laser tracker and indoor GPS.

Item Type:	Article
Keywords:	Metrology, Sensor, Uncertainty
Subjects:	Engineering Measurements > Dimensional
Divisions:	Engineering
Identification number/DOI:	10.1016/j.cirp.2019.04.077
Last Modified:	23 Oct 2019 13:53
URI:	http://eprintspublications.npl.co.uk/id/eprint/8535

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