Pfeifer, T; Montavon, B; Peterek, M; Hughes, B (2019) Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems. CIRP Annals, 68 (1). pp. 503-506. ISSN 00078506
Full text not available from this repository.Abstract
Recent metrology-based manufacturing paradigms impose requirements to Large-Scale Metrology systems that can be realised overcoming individual limitations using multi-sensor architectures. Competitive and cooperative data fusion presuppose measurement systems with different incompatible targets having aligned coordinate systems. This paper presents a registration method neither probing common features nor requiring calibrated artifacts but using an uncalibrated bar equipped with two targets at fixed locations moving on a random trajectory. The underlying mathematical model allows calculating transformation parameters including analytical propagation of statistical uncertainties. Method and model are successfully validated by Monte-Carlo simulations along with experiments using laser tracker and indoor GPS.
Item Type: | Article |
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Keywords: | Metrology, Sensor, Uncertainty |
Subjects: | Engineering Measurements > Dimensional |
Divisions: | Engineering |
Identification number/DOI: | 10.1016/j.cirp.2019.04.077 |
Last Modified: | 23 Oct 2019 13:53 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/8535 |
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