Haycocks, J; Jackson, K (2005) Traceable calibration of transfer standards for scanning probe microscopy. Precision Engineering, 29. pp. 168-175.
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Item Type: | Article |
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Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3184 |
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