Haycocks, J; Jackson, K; Robbie, C J; Stedman, M (1997) Traceable metrology for scanning probe microscopes. In: Proc. 2nd Seminar on Quantitive Microscopy, November 1997, PTB, Germany.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
Last Modified: | 02 Feb 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/774 |
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