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Demystifying data evaluation in the measurement of periodic structures

Necas, D; Yacoot, A; Valtr, M; Klapetek, P (2023) Demystifying data evaluation in the measurement of periodic structures. Measurement Science and Technology, 34 (5). 055015

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Periodic structures are often found in various areas of nanoscience and nanotechnology with many of them being used as for metrological purposes either, to calibrate instruments, or forming the basis measuring devices such as encoders. Evaluating the period of one or two-dimensional periodic structures from topography measurements, e.g. performed using scanning probe microscopy (SPM) methods, can be achieved using different methodologies with many grating evaluation methods having been proposed in past and applied to a handful of examples. The optimum methodology for determining the grating pitch is not immediately obvious. This paper reports the results of extensive large-scale simulations and analysis to evaluate the performance of both direct and Fourier space data processing methods. Many thousands of simulations have been performed on a variety of different gratings under different measurement conditions and including the simulation of defects encountered in real life situations. The paper concludes with a summary of the merits and disadvantages of the methods together with practical recommendations for the measurements of periodic structures and for developing algorithms for processing them.

Item Type: Article
Subjects: Engineering Measurements > Dimensional
Divisions: Materials and Mechanical Metrology
Identification number/DOI: 10.1088/1361-6501/acbab3
Last Modified: 30 Jun 2023 12:27
URI: http://eprintspublications.npl.co.uk/id/eprint/9767

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