Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Quadrature wavelength scanning interferometry. Appl. Opt., 55 (20). pp. 5332-5340.

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Abstract

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Item Type:	Article
Keywords:	surface measurement, interferometry
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Identification number/DOI:	10.1364/AO.55.005332
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/7167

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