Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Quadrature wavelength scanning interferometry. Appl. Opt., 55 (20). pp. 5332-5340.
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Item Type: | Article |
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Keywords: | surface measurement, interferometry |
Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
Identification number/DOI: | 10.1364/AO.55.005332 |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7167 |
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