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The lattice parameter of silicon: a secondary realisation of the metre

Yacoot, A; Bosse, H; Dixson, R (2020) The lattice parameter of silicon: a secondary realisation of the metre. Measurement Science and Technology, 31 (12). 121001 ISSN 0957-0233

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Abstract

The 2019 revision of the International System of Units (SI) linked the seven base units to fundamental constants; only a minor rewording was necessary for the metre whose definition was already linked to the speed of light. However,the largest change in the metre realisation since 1983 occurred with the adoption of the lattice parameter of silicon as a secondary realisation of the metre to support dimensional nanometrology. The traceability of the d220silicon lattice spacing has been established through x-ray interferometry with a relative uncertainty of 1.67×10-8 and three routes to traceability via the silicon lattice spacing have been formally recognised in the Mise en Pratiquefor the metre. This paper describes these routes and highlights the opportunities this new secondary realisation presents.

Item Type: Article
Subjects: Engineering Measurements > Dimensional
Divisions: Engineering
Identification number/DOI: 10.1088/1361-6501/abb2ba
Last Modified: 18 Jan 2021 14:44
URI: http://eprintspublications.npl.co.uk/id/eprint/9018

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