Brown, S; Stevens, R; Williams, D; McCarthy, M (2017) Colour imperfections in structured light projection for freeform measurement - a rapid test. Imaging Science Journal, 65 (5). pp. 293-298.

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Abstract

The performance of structured-light optical measuring systems is often limited by imperfections in the light patterns projected onto the object under test. An understanding of the fine structure of the patterns enables limits to be placed on the accuracy and precision of measurements that can be obtained with such systems.
This investigation has looked at imperfections in patterns of parallel lines projected in white light. Colour fringing, probably due to lateral chromatic aberration, has been revealed using a master pattern and the simple technique of magnification by means of moiré patterns. The moiré magnifier builds up an image from a large number of components of an array and therefore gives a representation of the average error over an area.
It is a very simple and robust device which may be convenient to use in an industrial production environment to provide a rapid check for the presence of colour fringing in light patterns with regular structures.

Item Type:	Article
Keywords:	Fringe projection, chromatic aberration
Subjects:	Engineering Measurements > Dimensional
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1080/13682199.2017.1331950
Last Modified:	06 Feb 2018 13:34
URI:	http://eprintspublications.npl.co.uk/id/eprint/7684

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