Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) Intelligent sampling for the measurement of structured surfaces. Meas. Sci. Technol., 23 (8). 085006
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Item Type: | Article |
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Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
Identification number/DOI: | 10.1088/0957-0233/23/8/085006 |
Last Modified: | 02 Feb 2018 13:14 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/5539 |
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