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Three-dimensional drift correction of scan data from atomic force microscopy using Lissajous scanning paths

Sun, X Z; Heaps, E; Yacoot, A; Yang, Q P; Grolich, P; Klapetek, P (2021) Three-dimensional drift correction of scan data from atomic force microscopy using Lissajous scanning paths. Measurement Science and Technology, 32 (11). 115010

Full text not available from this repository.
Item Type: Article
Subjects: Engineering Measurements > Dimensional
Divisions: Engineering
Identification number/DOI: 10.1088/1361-6501/ac100f
Last Modified: 20 Apr 2022 13:44
URI: http://eprintspublications.npl.co.uk/id/eprint/9418

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