Claverley, J D; Leach, R K (2010) Micro-scale co-ordinate metrology at the National Physical Laboratory. In: 36th International MATADOR Conference, 14 - 16 July 2010, Manchester, UK.

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Abstract

The development of the co-ordinate measuring machine (CMM) dramatically improved metrology in manufacturing environments. As modern manufacturing techniques have developed to supply products with ever decreasing dimensions, which depend on more accurate geometric specifications of micro-scale parts, developers of CMMs have responded accordingly. Initially, micro-scale probes for CMMs were developed and then, following further demand for micro-scale measurements, dedicated CMM platforms (micro-CMMs) were designed. The effectiveness of these micro-CMMs depends entirely on their ease of use and the access afforded by the probes to high aspect ratio features on micro-scale parts. The National Physical Laboratory (NPL) has purchased a commercial micro-CMM and is performing traceable measurements with the aim to better understand the limits of this technology. Initial work, both at NPL and around the world, has suggested that current micro-CMM platforms are capable of higher measurement accuracy than the probes they are instrumented with. To address this imbalance, NPL has developed a micro-scale probe that meets the stringent measurement demands of the manufacturing community. This paper will present the current research being undertaken on the commercial micro-CMM at NPL along with the recent advances in probe development.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Keywords:	micro-manufacturing, micro-metrology, micro-CMM, micro-CMM probe
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/4707

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