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Polarization-sensitive transfer matrix modeling for displacement measuring interferometry

Bridges, A; Yacoot, A; Kissinger, T; Tatam, R P (2020) Polarization-sensitive transfer matrix modeling for displacement measuring interferometry. Applied Optics, 59 (25). 7694 ISSN 1559-128X

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Item Type: Article
Subjects: Engineering Measurements > Dimensional
Divisions: Engineering
Identification number/DOI: 10.1364/AO.396922
Last Modified: 11 Nov 2020 15:38
URI: http://eprintspublications.npl.co.uk/id/eprint/8968

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