Yacoot, A; Downs, M J (2000) The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer. Meas. Sci. Technol., 11. pp. 1126-1130.
Full text not available from this repository.Item Type: | Article |
---|---|
Keywords: | x-ray interferometer, differential optical interferometry, laser stability, fringe interpolation, sub-nanometric accuracy |
Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
Last Modified: | 02 Feb 2018 13:17 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1624 |
Actions (login required)
![]() |
View Item |