Yacoot, A; Downs, M J (2000) The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer. Meas. Sci. Technol., 11. pp. 1126-1130.

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Item Type:	Article
Keywords:	x-ray interferometer, differential optical interferometry, laser stability, fringe interpolation, sub-nanometric accuracy
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/1624

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