Items where Author is "Seah, M P"

Matjacic, L; Seah, M P; Trindade, G F; Pirkl, A; Havelund, R; Vorng, J L; Niehuis, E; Gilmore, I S (2022) OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure. Surface and Interface Analysis, 54 (4). pp. 331-340.

Pei, Y; Cant, D J H; Havelund, R; Stewart, M; Mingard, K; Seah, M P; Minelli, C; Shard, A G (2020) Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles. The Journal of Physical Chemistry C, 124 (43). pp. 23752-23763. ISSN 1932-7447

Tiddia, M; Seah, M P; Shard, A G; Mula, G; Havelund, R; Gilmore, I S (2020) Argon cluster cleaning of Ga + FIB‐milled sections of organic and hybrid materials. Surface and Interface Analysis, 52 (6). pp. 327-334. ISSN 0142-2421

Shard, A G; Havelund, R; Seah, M P; Clifford, C A (2019) Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials. Surface and Interface Analysis, 51 (10). pp. 1018-1020. ISSN 0142-2421

Havelund, R; Seah, M P; Gilmore, I S (2019) SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles. Surface and Interface Analysis, 51 (13). pp. 1332-1341. ISSN 0142-2421

Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S (2019) Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions. Journal of The American Society for Mass Spectrometry, 30 (2). pp. 309-320. ISSN 1044-0305

Tiddia, M; Mihara, I; Seah, M P; Trindade, G F; Kollmer, F; Roberts, C J; Hague, R; Mula, G; Gilmore, I S; Havelund, R (2019) Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 11 (4). pp. 4500-4506. ISSN 1944-8244

Seah, M P; Shard, A G (2018) The Matrix Effect in Secondary Ion Mass Spectrometry. Applied Surface Science, 429. pp. 605-611.

Havelund, R; Seah, M P; Tiddia, M; Gilmore, I S (2018) SIMS of organic materials-interface location in argon gas cluster depth profiles using negative-secondary ions. Journal of the American Society for Mass Spectrometry, 29 (4). pp. 774-785.

Seah, M P (2018) Analytic function to describe interfaces and resolution consistency in sputter depth profiling. Surface and Interface Analysis, 50 (1). pp. 123-127.

Rakowska, P D; Seah, M P; Vorng, J L; Havelund, R; Gilmore, I S (2016) Determination of the sputtering yield of cholesterol using Ar-n(+) and C-60(+(+)) cluster ions. Analyst, 141 (16). pp. 4893-4901.

Yokoyama, Y*; Aoyagi, S*; Fujii, M*; Matsuo, J*; Fletcher, J S*; Lockyer, N P*; Vickerman, J C*; Passarelli, M K; Havelund, R; Seah, M P (2016) Peptide fragmentation and surface structural analysis by means of ToF-SIMS using large cluster ion sources. Anal. Chem., 88 (7). pp. 3592-3597.

Seah, M P; Havelund, R; Gilmore, I S (2016) SIMS of delta layers in organic materials: amount of substance, secondary ion species, matrix effects and anomalous structures in argon gas cluster depth profiles. J. Phys. Chem. C, 120 (46). pp. 26328-26335.

Havelund, R; Seah, M P; Gilmore, I S (2016) Sampling depths, depth shifts and depth resolutions for Bi-n(+) ion analysis in argon gas cluster depth profiles. J. Phys. Chem. B, 120 (9). pp. 2604-2611.

Vorng, J L; Kotowska, A M; Passarelli, M K; West, A*; Marshall, P S*; Havelund, R; Seah, M P; Dollery, C T*; Rakowska, P D; Gilmore, I S (2016) Semiempirical rules to determine drug sensitivity and ionization efficiency in secondary ion mass spectrometry using a model tissue sample. Anal. Chem., 88 (22). pp. 11028-11036.

Seah, M P; Havelund, R; Gilmore, I S (2016) Systematic temperature effects in the argon cluster ion sputter depth profiling of organic materials using secondary ion mass spectrometry. J. Am. Soc. Mass Spectrom., 27 (8). pp. 1411-1418.

Seah, M P; Spencer, S J; Shard, A G (2015) Angle-dependence of argon gas cluster sputtering yields for organic materials. J. Phys. Chem. B, 119 (7). pp. 3297-3303.

Seah, M P (2015) Argon cluster size-dependence of sputtering yields of polymers: molecular weights and the universal equation. Surf. Interface Anal., 47 (1). pp. 169-172.

Seah, M P; Spencer, S; Havelund, R; Gilmore, I S; Shard, A G (2015) Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size. Analyst, 140 (19). pp. 6508-6516.

Seah, M P; Havelund, R; Shard, A G; Gilmore, I S (2015) Sputtering yields for mixtures of organic materials using argon gas cluster ions. J. Phys. Chem. B, 119 (42). pp. 13433-13439.

Havelund, R; Seah, M P; Shard, A G; Gilmore, I S (2014) Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics. J. Am. Soc. Mass Spectrom., 25 (9). pp. 1565-1571.

Seah, M P (2014) Measurement of the roughness of nano-scale surfaces, both unannealed and with limited anneal, by atomic force microscopy. Meas. Sci. Technol., 25 (10). 105001

Pollard, A J; Brennan, B; Stec, H*; Tyler, B J; Seah, M P; Gilmore, I S; Roy, D (2014) Quantitative characterization of defect size in graphene using Raman spectroscopy. Appl. Phys. Lett., 105 (25). 253107

Seah, M P (2014) Summary of ISO/TC 201 standard: ISO 18115-1:2013 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy. Surf. Interface Anal., 46 (5). pp. 357-360.

Seah, M P (2014) Summary of ISO/TC 201 standard: ISO 18115-2:2013 - surface chemical analysis - vocabulary - terms used in scanning probe microscopy. Surf. Interface Anal., 46 (5). pp. 361-364.

Seah, M P; Havelund, R; Gilmore, I S (2014) Universal equation for argon cluster size-dependence of secondary ion spectra in SIMS of organic materials. J. Phys. Chem. C, 118 (24). pp. 12862-12872.

Gurdak, E; Green, F M; Rakowska, P D; Seah, M P; Salter, T L; Gilmore, I S (2014) VAMAS interlaboratory study for Desorption Electrospray Ionisation Mass Spectroscopy (DESI MS) intensity repeatability and constancy. Anal. Chem., 86 (19). pp. 9603-9611.

Yang, L; Seah, M P; Gilmore, I S; Morris, R J H*; Dowsett, M G*; Boarino, L*; Sparnacci, K*; Laus, M* (2013) Depth profiling and melting of nanoparticles in Secondary Ion Mass Spectrometry (SIMS). J. Phys. Chem. C, 117 (31). pp. 16042-16052.

Seah, M P; Spencer, S J; Shard, A G (2013) Depth resolution, angle-dependence and the sputtering yield of irganox 1010 by coronene primary ions. J. Phys. Chem. B, 117 (39). pp. 1185-11892.

Seah, M P (2013) Nanoscale roughness and bias in step height measurements by atomic force microscopy. Meas. Sci. Technol., 24 (3). 035004

Seah, M P (2013) Universal equation for argon gas cluster sputtering yields. J. Phys. Chem. C, 117 (24). pp. 12622-12632.

Shard, A G; Havelund, R*; Seah, M P; Spencer, S J; Gilmore, I S; Winograd, N*; Mao, D*; Miyayama, T*; Niehuis, E*; Rading, D*; Moellers, R* (2012) Argon cluster ion beams for organic depth profiling: results from a VAMAS inter-laboratory study. Anal. Chem., 84 (18). pp. 7865-7873.

Aoyagi, S*; Gilmore, I S; Mihara, I*; Seah, M P; Fletcher, I W* (2012) Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram. Rapid Commun. Mass Spectrom., 26 (23). pp. 2815-2821.

Lee, J L S; Gilmore, I S; Seah, M P (2012) Linearity of the instrumental intensity scale in TOF-SIMS - a VAMAS interlaboratory study. Surf. Interface Anal., 44 (1). pp. 1-14.

Clifford, C A; Seah, M P (2012) Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues. Nanotechnology, 23 (16). 165704

Clifford, C A; Sano, N*; Doyle, P*; Seah, M P (2012) Nanomechanical measurements of hair as an example of micro-fibres analysis using atomic force microscopy nanoindentation. Ultramicroscopy, 114. pp. 38-45.

Seah, M P (2012) Simple universal curve for the energy dependent electron attenuation length for all materials. Surf. Interface Anal., 44 (10). pp. 1353-1359.

Yang, L; Seah, M P; Gilmore, I S (2012) Sputtering yields for gold using argon gas cluster ion beams. J. Phys. Chem. C, 116 (44). pp. 23735-23741.

Yang, L; Seah, M P; Anstis, E H; Gilmore, I S; Lee, J L S (2012) Sputtering yields of gold nanoparticles by C60 ions. J. Phys. Chem. C, 116 (16). pp. 9311-9318.

Seah, M P (2012) Summary of ISO/TC 201 Standard: ISO 14701:2011 - Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness. Surf. Interface Anal., 44 (7). pp. 876-878.

Seah, M P (2012) Summary of ISO/TC 201 Standard: ISO 18115-1:2010 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy. Surf. Interface Anal., 44 (5). pp. 618-620.

Seah, M P (2012) Summary of ISO/TC 201 Standard: ISO 18115-2:2010 - Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy. Surf. Interface Anal., 44 (7). pp. 879-880.

Lee, J L S; Gilmore, I S; Seah, M P; Levick, A P; Shard, A G (2012) Topography and field effects in secondary ion mass spectrometry - Part II: insulating samples. Surf. Interface Anal., 44 (2). pp. 238-245.

Seah, M P (2012) Topography effects and monatomic ion sputtering of undulating surfaces, particles and large nanoparticles: Sputtering yields, effective sputter rates and topography evolution. Surf. Interface Anal., 44 (2). pp. 208-218.

Seah, M P (2012) An accurate and simple universal curve for the energy dependent electron inelastic mean free path. Surf. Interface Anal., 44 (4). pp. 497-503.

Green, F M; Seah, M P; Gilmore, I S; Salter, T L; Spencer, S J (2011) Analysis of thin films and molecular orientation using cluster SIMS. Surf. Interface Anal., 43 (9). pp. 1224-1230.

Seah, M P; Spencer, S J (2011) Attenuation lengths in organic materials. Surf. Interface Anal., 43 (3). pp. 744-751.

Seah, M P; Gilmore, I S (2011) Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS. Surf. Interface Anal., 43 (1-2). pp. 228-235.

Shard, A G; Seah, M P (2011) Depth resolution and inhomogeneity of the sputtering dose with sample rotation and ion beam rastering. Surf. Interface Anal., 43 (11). pp. 1430-1435.

Seah, M P; Spencer, S J (2011) Energy dependence of the electron attenuation length in silicon dioxide. Meas. Sci. Technol., 22 (11). 115602

Green, F M; Gilmore, I S; Seah, M P (2011) Mass Spectrometry and informatics: Distribution of molecules in the PubChem database and general requirements for mass accuracy. Anal. Chem., 83 (9). pp. 3239-3243.

Lee, J L S; Gilmore, I S; Seah, M P; Fletcher, I W* (2011) Topography and field effects in secondary ion mass spectrometry - Part I: conducting samples. J. Am. Soc. Mass Spectrom., 22 (10). pp. 1718-1728.

Shard, A G; Ray, S; Seah, M P; Yang, L (2011) VAMAS interlaboratory study on organic depth profiling. Surf. Interface Anal., 43 (9). pp. 1240-1250.

Salter, T L; Green, F M; Gilmore, I S; Seah, M P; Stokes, P* (2011) A comparison of SIMS and DESI and their complementarities. Surf. Interface Anal., 43 (1-2). pp. 294-297.

Baer, D R*; Lea, A S*; Geller, J D*; Hammond, J S*; Kover, L*; Powell, C J*; Seah, M P; Suzuki, M*; Watts, J F*; Wolstenholme, J* (2010) Approaches to analyzing insulators with Auger electron spectroscopy: update and overview. J. Electron Spectrosc. Relat. Phenom., 176 (1-3). pp. 80-94.

Seah, M P; Green, F M; Gilmore, I S (2010) Cluster primary ion sputtering: secondary ion intensities in static SIMS of organic materials. J. Phys. Chem. C, 114 (12). pp. 5351-5359.

Yang, L; Svarnas, P*; Shard, A G*; Bradley, J W*; Seah, M P (2010) Correlations for predicting the surface wettability for organic light-emitting-diode patterns by x-ray photoelectron spectroscopy analysis. J. Appl. Phys., 108 (11). 114901

Seah, M P; Mulcahy, C P A*; Biswas, S* (2010) Non-linearities in depth profiling nanometre layers. J. Vac. Sci. Technol. B, 28 (6). pp. 1215-1221.

Lee, J L S; Nimomiya, S*; Matsuo, J*; Gilmore, I S; Seah, M P; Shard, A G (2010) Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Anal. Chem., 82 (1). pp. 98-105.

Seah, M P; Green, F M; Gilmore, I S (2010) Relationships between cluster secondary ion mass intensities generated by different cluster primary ions. J. Am. Soc. Mass Spectrom., 21 (3). pp. 370-377.

Seah, M P; Nunney, T S* (2010) Sputtering yields of compounds using argon ions. J. Phys. D, Appl. Phys., 43 (25). 253001

Green, F M; Gilmore, I S; Lee, J L S; Spencer, S J; Seah, M P (2010) Static SIMS - VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification. Surf. Interface Anal., 42 (3). pp. 129-138.

Green, F M; Shard, A G; Gilmore, I S; Seah, M P (2009) Analysis of the interface position in C60n+ Secondary Ions Mass Spectrommetry depth profiling. Anal. Chem., 81 (1). pp. 75-79.

Seah, M P; Spencer, S J (2009) Angular accuracy and the comparison of two methods for determining the surface normal in a Kratos Axis Ultra X-ray photoelectron spectrometer. Surf. Interface Anal., 41 (12-13). pp. 960-965.

Green, F M; Stokes, P*; Hopley, C*; Seah, M P; Gilmore, I S; O'Connor, G* (2009) Developing repeatable measurements for reliable ambient surface characterisation using DESI. Anal. Chem., 81 (6). pp. 2286-2293.

Seah, M P; Gilmore, I S; Green, F M (2009) G-SIMS: relative effectiveness of different monatomic primary ion source combinations. Rapid Commun. Mass Spectrom., 23 (5). pp. 599-602.

Clifford, C A; Seah, M P (2009) Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods. Meas. Sci. Technol., 12 (12). 125501

Lee, J L S; Gilmore, I S; Fletcher, I W*; Seah, M P (2009) Multivariate image analysis strategies for ToF-SIMS images with topography. Surf. Interface Anal., 41 (8). pp. 653-665.

Clifford, C A; Seah, M P (2009) Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios. Nanotechnology, 20 (14). 145708

Clifford, C A; Seah, M P (2009) Simplified drift characterisation in scanning probe microscopes using a simple two-point method. Meas. Sci. Technol., 20 (9). 095103

Werner, Z*; Szymczyk, W*; Piekoszewski, J*; Seah, M P; Ratajczak, R*; Nowicki, L*; Barlak, M*; Richter, E* (2009) Stoichiometric MgB2 layers produced by multiple-energy implantation of boron into magnesium. Surf. Coat. Technol., 203 (17-18). pp. 2712-2716.

Seah, M P; Unger, W E S*; Hai Wang*,; Jordaan, W*; Gross, Th*; Dura, J A*; Dae Won Moon*,; Totarong, P*; Krumrey, M*; Hauert, R*; Mo Zhiqiang* (2009) Ultra thin SiO2 on Si IX: Absolute Measurements of the Amount of silicon oxide as a thickness of SiO2 on Si. Surf. Interface Anal., 41 (5). pp. 430-439.

Lee, J L S; Tyler, B J*; Wagner, M S*; Gilmore, I S; Seah, M P (2009) The development of standards and guides for multivariate analysis in surface chemical analysis. Surf. Interface Anal., 41 (2). pp. 76-78.

Lee, J L S; Seah, M P; Gilmore, I S (2008) Artifacts in the Sputtering of Inorganics by C60 n+. Appl. Surf. Sci., 255 (4). pp. 934-937.

Seah, M P (2008) CCQM-K32 key comparison and P84 pilot study amount of silicon oxide as a thickness of SiO2 on Si. Metrologia, 45 (Techni). 08013.

Green, F M; Gilmore, I S; Seah, M P (2008) Cluster ion beam profiling of organics by secondary ion mass spectrometry - does sodium affect the molecular ion intensity at interfaces. Rapid Commun. Mass Spectrom., 22 (12). pp. 4178-4182.

Seah, M P (2008) Cluster primary ions: spikes, sputtering yields, secondary ion yields and inter-relationships for secondary molecular ions for static SIMS. J. Vac. Sci. Technol. A, 26 (4). pp. 660-667.

Seah, M P (2008) Comment on "Identification of background in CMA" [J. Surf. Anal. 14, 95 (2007)]. J. Surf. Anal., 14 (2). p. 169.

Green, F M; Gilmore, I S; Seah, M P (2008) G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides. Appl. Surf. Sci., 255 (4). pp. 852-855.

Green, F M; Gilmore, I S; Seah, M P; Dell, E J* (2008) Identification of complex molecules at surfaces: G-SIMS and SMILES fragmentation pathways. Int. J Mass Spectrom., 272. pp. 38-47.

Green, F M; Kollmer, F*; Niehuis, E*; Gilmore, I S; Seah, M P (2008) Imaging G-SIMS: A novel bismuth-manganese source emitter. Rapid Commun. Mass Spectrom., 22 (16). pp. 2602-2608.

Gilham, R J J; Spencer, S J; Butterfield, D M; Seah, M P; Quincey, P G (2008) On the applicability of XPS for quantitative total organic and elemental carbon analysis of airborne particulate matter. Atmos. Environ., 42 (16). pp. 3888-3891.

Lee, J L S; Gilmore, I S; Seah, M P (2008) Quantification and methodology issues in the multivariate analysis of ToF-SIMS data for mixed organic systems. Surf. Interface Anal., 40 (1). pp. 1-14.

Shard, A G; Green, F M; Brewer, P J; Seah, M P; Gilmore, I S (2008) Quantitative molecular depth profiling of organic delta-layers by C-60 ion sputtering and SIMS. J. Phys. Chem. B, 112 (9). pp. 2596-2605.

Seah, M P (2008) Sputtering, cluster primary ions and static SIMS. J. Surf. Anal., 14 (4). pp. 305-311.

Seah, M P (2008) Summary of ISO/TC 201 Standard: XXXIII, ISO 18115:2001/Amd. 2:2007 - Surface Chemical Analysis - Vocabulary - Amendment 2. Surf. Interface Anal., 40 (11). pp. 1500-1502.

Lee, J L S; Gilmore, I S; Fletcher, I W*; Seah, M P (2008) Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS. Appl. Surf. Sci., 255 (4). pp. 1560-1563.

Seah, M P (2007) Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry. Surf. Interface Anal., 39. pp. 634-643.

Seah, M P (2007) Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials. Surf. Interface Anal., 39 (11). pp. 890-897.

Seah, M P (2007) Comparison of the accuracies of two methods for the determination of the surface normal for X-ray photoelectron spectroscopy. Metrologia, 44. pp. 242-245.

Seah, M P; Gilmore, I S (2007) Erratum - Quantitative x-ray photoelectron spectroscopy: Quadrupole effects, shake-up, Shirley background and relative sensitivity factors from a database of true x-ray photoelectron spectra [Phys. Rev. B 73, 174113 (2006)]. Phys. Rev. B Condens. Matter, 75 (14). 149901(E)

Gilmore, I S; Green, F M; Seah, M P (2006) G-SIMS-FPM: Molecular structure at surfaces - a combined positive and negative secondary ion study. Appl. Surf. Sci., 252 (19). pp. 6601-6604.

Green, F M; Gilmore, I S; Seah, M P (2006) Mass accuracy - TOF-SIMS. Appl. Surf. Sci., 252 (19). pp. 6591-6593.

Clifford, C A; Seah, M P (2006) Modelling of nanomechanical nanoindentation measurements using an AFM or nanoindenter for compliant layers on stiffer substrates. Nanotechnology, 17. pp. 5283-5292.

Seah, M P; Gilmore, I S (2006) Quantitative x-ray photoelectron spectroscopy: quadrupole effects, shake-up, Shirley background and relative sensitivity factors. Phys. Rev. B Condens. Matter, 73. 174113

Seah, M P (2006) Recent advances to establish XPS as an accurate metrology tool. J. Surf. Anal., 13. pp. 136-141.

Seah, M P; Spencer, S J (2006) Repeatability intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151. pp. 178-181.

Seah, M P; Spencer, S J (2006) Repeatable intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151 (3). pp. 178-181.

Green, F; Gilmore, I S; Seah, M P (2006) TOF-SIMS: accurate mass scale calibration. J. Am. Soc. Mass Spectrom., 17 (4). pp. 514-523.

Seah, M P (2005) Accurate thickness measurements in thin films with surface analysis. Journal of Surface Analysis, 12. pp. 70-77.

Seah, M P (2005) Erratum to 'An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions' [Nucl. Instr. and Meth. B, 229 (2005) 348-358]. Nucl. Instrum. Methods Phys. Res. B, Beam Interact. Mater. At., 239 (3). pp. 286-287.

Clifford, C A; Seah, M P (2005) Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurements via AFM nanoindentation. Appl. Surf. Sci., 252 (5). pp. 1915-1933.

Gilmore, I S; Seah, M P; Green, F M (2005) Static TOF-SIMS - a VAMAS interlaboratory study. Part 1. Repeatability and reproducibility of spectra. Surf. Interface Anal., 37. pp. 651-672.

Gilmore, I S; Seah, M P; Green, F M (2005) Static TOF-SIMS - a VAMAS interlaboratory study. Part 1. Repeatability and reproducibility of spectra. Surf. Interface Anal., 37 (8). pp. 651-672.

Seah, M P (2005) Ultrathin SiO2 on Si, VI:evaluation of uncertainties in thickness measurement using XPS. Surf. Interface Anal., 37. pp. 300-309.

Seah, M P; Spencer, S J (2005) Ultrathin SiO2 on Si, VII: angular accuracy in XPS and an accurate attenuation length. Surf. Interface Anal., 37. pp. 731-736.

Seah, M P; Clifford, C A; Green, F M; Gilmore, I S (2005) An accurate semi-empirical equation for sputtering yields, I: for argon ions. Surf. Interface Anal., 37. pp. 444-458.

Seah, M P (2005) An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions. Nucl. Instrum. Methods Phys. Res. B, Beam Interact. Mater. At., 229 (3-4). pp. 348-358.

Clifford, C A; Seah, M P (2005) The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis. Nanotechnology, 16 (9). pp. 1666-1680.

Dura, J A*; Seah, M P (2004) Advances in measurement: neutron reflectometry for highly accurate nanometer metrology.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinlander, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyun Mo Cho*,; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Baily, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36 (9). pp. 1269-1303.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinländer, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyan Mo Cho*,; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Bailey, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36. pp. 1269-1303.

Seah, M P (2004) Intercomparison of silicon dioxide thickness measurements made by multiple techniques - the route to accuracy. J. Vac. Sci. Technol. A, 22 (4). pp. 1564-1571.

Clifford, C A; Cumpson, P J; Seah, M P (2004) Nano-analysis using Atomic Force Microscopy. VAM Bulletin, 31. pp. 21-25.

Gilmore, I S; Seah, M P (2004) Organic molecule characterization - G-SIMS. Appl. Surf. Sci., 231-23. pp. 224-229.

Seah, M P (2004) Summary of ISO/TC 201 standard: XXI, ISO 21270:2004 - surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - linearity of intensity scale. Surf. Interface Anal., 36. pp. 1645-1646.

Seah, M P (2004) Summary of ISO/TC 201 standard: XXI. ISO 21270: 2004 - surface chemical analysis - X-ray photoelectron spectroscopy and Auger electron spectrometers - linearity of intensity scale. Surf. Interface Anal., 36. pp. 1645-1646.

Gilmore, I S; Seah, M P; Henderson, A* (2004) Summary of ISO/TC 201 standard: XXII. ISO 22048:2004 - surface chemical analysis - information format for static secondary ion mass spectrometry. Surf. Interface Anal., 36. pp. 1642-1644.

Seah, M P; Spencer, S J (2003) Degradation of poly(vinyl chloride) and nitrocellulose in XPS. Surf. Interface Anal., 35. pp. 906-913.

Gilmore, I S; Seah, M P (2003) G-SIMS of crystallisable organics. Appl. Surf. Sci., 203-20. pp. 551-555.

Gilmore, I S; Seah, M P (2003) Investigating the difficulty of eliminating flood gun damage in TOF-SIMS. Appl. Surf. Sci., 203-20. pp. 600-604.

Gilmore, I S; Seah, M P; Johnstone, J E (2003) Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend. Surf. Interface Anal., 35. pp. 888-896.

Seah, M P (2003) Summary of ISO/TC 201 standard XI. ISO 17974:2002 - Surface chemical analysis - high-resolution Auger electron spectrometers - calibration of energy scales for elemental and chemical-state analysis. Surf. Interface Anal., 35. pp. 327-328.

Seah, M P (2003) Summary of ISO/TC 201 standard XII. ISO 17973:2002 - Surface chemical analysis - medium-resolution Auger electron spectrometers - calibration of energy scales for elemental analysis. Surf. Interface Anal., 35. pp. 329-330.

Seah, M P; Spencer, S J (2003) Ultra-thin SiO2 on Si: IV, thickness linearity and intensity measurements in XPS. Surf. Interface Anal., 35. pp. 515-524.

Seah, M P; Spencer, S J (2003) Ultrathin Sio2 on Si. I quantifying and removing carbonaceous contamination. J. Vac. Sci. Technol. A, 21 (2). pp. 345-352.

Gilmore, I S; Seah, M P (2002) Electron flood gun damage in the analysis of polymers and organics in time of flight SIMS. Appl. Surf. Sci., 187. pp. 89-100.

Seah, M P (2002) Quantitative AES and XPS: tests of theory using AES and XPS databases with REELS background subtraction. Journal of Surface Analysis, 9. pp. 275-280.

Seah, M P (2002) Resolution parameters for model functions used in surface analysis. Surf. Interface Anal., 33. pp. 950-953.

Seah, M P; Spencer, S J (2002) Ultra-thin SiO2 on Si: II, issues in quantification of the oxide thickness. Surf. Interface Anal., 33. pp. 640-652.

Seah, M P; White, R* (2002) Ultra-thin SiO2 on Si: III mapping the layer thickness efficiently by XPS. Surf. Interface Anal., 33. pp. 960-963.

Seah, M P (2001) Background subtraction III: the application of REELS data to background removal in AES and XPS. Surf. Sci., 471. pp. 185-202.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities and sensitivity factors from spectral digital databases re-analysed using a REELS database. Surf. Interface Anal., 31. pp. 778-795.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities from elemental spectra in digital databases reanalysed with a REELS database. Surf. Interface Anal., 31. pp. 778-795.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative XPS I: analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database. J. Electron Spectrosc. Relat. Phenom., 120 (1-3). pp. 93-111.

Seah, M P; Gilmore, I S (2001) Simplified equations for correction parameters for elastic scattering effects for Q, ß and attenuation lengths in AES and XPS. Surf. Interface Anal., 31. pp. 835-846.

Seah, M P (2001) Summary of ISO/TC 201 standard: VII ISO 15472:2001 - Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales. Surf. Interface Anal., 31. pp. 721-723.

Seah, M P (2001) Summary of ISO/TC 201 standard: VIII, ISO 18115:2001 - Surface chemical analysis - vocabulary. Surf. Interface Anal., 31. pp. 1048-1049.

Seah, M P; Spencer, S J (2000) AES of bulk insulators - control and characterisation of surface charge. J. Electron Spectrosc. Relat. Phenom., 109. pp. 291-380.

Seah, M P; Gilmore, I S; Spencer, S J (2000) Background subtraction II: general behaviour of REELS and the Tougaard universal cross section in the removal of backgrounds in AES and XPS. Surf. Sci., 461. pp. 1-15.

Seah, M P; Gilmore, I S; Spencer, S J (2000) Consistent, combined quantitative AES and XPS digital data bases - convergence of theory and experiment. J. Vac. Sci. Technol. A, 18. pp. 1083-1088.

Seah, M P; Spencer, S J; Gilmore, I S; Johnstone, J E (2000) Depth resolution in sputter depth profiling - characterisation of a tantalum pentoxide on tantalum certified reference material. Surf. Interface Anal., 29. pp. 73-81.

Gilmore, I S; Seah, M P (2000) Ion detection efficiency in SIMS: dependencies on energy, mass and composition for microchannel plates used in mass spectrometry. Int. J Mass Spectrom., 202. pp. 217-229.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter - induced cone and filament formation ob InP and AFM tip shape determination. Surf. Interface Anal., 29. pp. 782-790.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter-induced cone and filiment formation on InP and AFM tip shapes determination. Surf. Interface Anal., 29. pp. 782-790.

Gilmore, I S; Seah, M P (2000) Static SIMS: an inter-laboratory study. Surf. Interface Anal., 29. pp. 624-637.

Gilmore, I S; Seah, M P (2000) Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure. Appl. Surf. Sci., 161. pp. 465-480.

Seah, M P (1999) Background subtraction I: general behaviour of tougaard - style backgrounds in AES and XPS. Surf. Sci., 420. pp. 285-294.

Seah, M P (1999) Background subtraction. 1. General behaviour of Tougaard-style backgrounds in AES and XPS. Surf. Sci., 420 (2-3). pp. 285-94.

Seah, M P; Spencer, S J; Cumpson, P J; Johnson, J E (1999) Cones formed during sputtering of InP and their use in defining AFM tip shapes. Appl. Surf. Sci., 144-14. pp. 151-155.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Appl. Surf. Sci., 144-14. pp. 178-182.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy. Appl. Surf. Sci., 144-14. pp. 132-136.

Seah, M P (1999) New aspects in quantitative surface analysis. Journal of Surface Analysis (Japan), 5 (1). pp. 7-11.

Seah, M P (1999) Quantitative AES and XPS - convergence between theory and experimental databases. J. Electron Spectrosc., 100. pp. 55-73.

Seah, M P (1999) Quantitative AES and XPS: convergance between theory and experimental databases. J. Electron Spectrosc. Relat. Phenom., 100. pp. 55-73.

Seah, M P (1999) Reference data for AES and XPS combined. Appl. Surf. Sci., 144-14. pp. 161-167.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Signal linearity in XPS counting systems. J. Electron Spectrosc. Relat. Phenom., 104. pp. 73-89.

Gilmore, I S; Seah, M P (1999) Static SIMS - metastable decay and peak intensities. Appl. Surf. Sci., 144-14. pp. 26-30.

Gilmore, I S; Seah, M P (1999) Static SIMS: ion detection efficiencies in a channel electron multiplier. Appl. Surf. Sci., 144-14. pp. 113-117.

Seah, M P (1999) Summary of ISO standard: I ISO 14976:1998 - surface chemical analysis - data transfer format. Surf. Interface Anal., 27. pp. 693-694.

Seah, M P; Brown, M T (1999) Validation and accuracy of peak synthesis software for XPS. Appl. Surf. Sci., 144-14. pp. 183-187.

Seah, M P (1998) AES energy calibration of electron spectrometers IV - a re-evaluation of the reference energies. J. Electron Spectrosc. Relat. Phenom., 97 (3). pp. 235-241.

Seah, M P; Gilmore, I S (1998) Quantitative AES VII: The ionisation cross section. Surf. Interface Anal., 26 (11). pp. 815-824.

Seah, M P; Gilmore, I S (1998) Quantitative AES VIII: analysis of Auger electron intensities from elemental data in a digital Auger database. Surf. Interface Anal., 26 (12). pp. 908-929.

Seah, M P; Gilmore, I S; Bishop, H E* (1998) Quantitive AES, V: Practical analysis of intensities with detailed examples of metals and their oxides. Surf. Interface Anal., 26 (10). pp. 701-722.

Seah, M P; Gilmore, I S (1998) Quantitive AES, VI: Backscattering and backgrounds - an analysis of elemental systematics and corrections of absolute intensity. Surf. Interface Anal., 26 (10). pp. 723-735.

Seah, M P; Brown, M T (1998) Validation and accuracy of peak synthesis software for XPS. J. Electron Spectrosc. Relat. Phenom., 95 (1). pp. 71-93.

Seah, M P; Gilmore, I S; Beamson, G (1998) XPS: Binding energy calibration of electron spectometers 5 - a re-assessment of the reference energies. Surf. Interface Anal., 26. pp. 642-649.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: Binding energy calibration of electron spectrometers 4 - Assessment of effects for different X-ray sources, analyser resolutions, angles of emmision and overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

Seah, M P; Gilmore, I S; Beamson, G* (1998) XPS: binding energy calibration of electron spectrometers 5 - a re-assessment of the reference energies. Surf. Interface Anal., 26. pp. 642-649.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

Cumpson, P J; Seah, M P; Spencer, S J (1998) The calibration of Auger and X-ray photoelectron spectrometers for valid analytical measurements. Spectrosc. Eur., 10 (3). pp. 8-15.

Seah, M P; Gilmore, I S (1997) AES: energy calibration of electron spectrometers. III - general calibration rules. J. Electron Spectrosc. Relat. Phenom., 83 (2-3). pp. 197-208.

Cumpson, P J; Seah, M P (1997) Elastic scattering corrections in AES and XPS II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments. Surf. Interface Anal., 25. pp. 430-446.

Cumpson, P J; Seah, M P (1997) Elastic scattering corrections in AES and XPS: II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments. Surf. Interface Anal., 25. pp. 430-446.

Seah, M P (1997) Surface chemical analysis: comparing and exchanging data. J. Vac. Sci. Technol.,, 15 (3). pp. 485-492.

Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc., 87. pp. 159-167.

Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitive measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom., 87. pp. 159-167.

Seah, M P; Gilmore, I S (1996) High resolution digital Auger database of true spectra for Auger electron spectroscopy intensities. J. Vac. Sci. Technol. A, 14 (3). pp. 1401-1407.

Seah, M P (1996) Quantitive AES. IV. Accuracy of the numerical evaluation of peak areas in AES using the Universal Tougaard Background Subtraction method. Surf. Interface Anal., 24 (12). pp. 830-838.

Gilmore, I S; Seah, M P (1996) Savitzky and Golay differentiation in AES. Appl. Surf. Sci., 93 (3). pp. 273-280.

Cumpson, P J; Seah, M P; Spencer, S J (1996) Simple procedure for precise peak maximum estimation for energy calibration in AES and XPS. Surf. Interface Anal., 24 (10). pp. 687-694.

Cumpson, P J; Seah, M P (1996) Stability of reference masses IV: growth of carbonaceous contamination on platinum-iridium alloy surfaces, and cleaning by UV/ozone treatment. Metrologia, 33 (6). pp. 507-532.

Seah, M P (1996) Standards for surface analysis: a clash between bureaucracy and science? Phil. Trans. R. Soc. Lond. A, 354 (1719). pp. 2765-2780.

Gilmore, I S; Seah, M P (1996) Static SIMS: a study of damage in polymers. Surf. Interface Anal., 24 (11). pp. 746-762.

Seah, M P; Gilmore, I S (1996) A high resolution digital Auger database of true spectra for AES intensities. J. Vac. Sci. Technol., 14. pp. 1401-1407.

Seah, M P (1995) Effective dead time in pulse counting systems. Surf. Interface Anal., 23 (10). pp. 729-32.

Gilmore, I S; Seah, M P (1995) Fluence, Flux, Current and Current Density Measurement in Faraday Cups for Surface Analysis. Surf. Interface Anal., 23 (4). pp. 248-258.

Seah, M P (1995) Reference materials for surface analysis. VAM Bulletin, 12. pp. 27-29.

Gilmore, I S; Seah, M P (1995) Static SIMS: surface charge stabilisation of insulators for highly repeatable spectra when using a quadrupole mass spectrometer. Surf. Interface Anal., 23. 191 - 203

Gilmore, I S; Seah, M P (1995) Surface analysis of insulators - a new charge neutralisation system. NPL News, 375. p. 9.

Seah, M P (1995) Surface chemical analysis and the VAM principles. Analytical Proceedings, 32 (12). pp. 523-524.

Seah, M P (1995) Surface chemical analysis in an international context. VAM Bulletin, 13. pp. 16-17.

Seah, M P (1995) Work functions and electron spectroscopy. J. Surf. Anal, 1 (3). pp. 409-410.

Seah, M P (1995) A calibration system for Auger electron spectroscopy. VAM Bulletin, 13. pp. 28-29.

Seah, M P (1995) A system for the intensity calibration of electron spectrometers. J. Electron Spectrosc. Relat. Phenom., 71. 191 - 204

Seah, M P (1994) Comment on 'Neglected and hidden errors in the quantification of Auger electron spectroscopy' by J. du Plessis (Surf. Interface Anal. 20, 228 (1993)). Surf. Interface Anal., 21. 587 - 589

Seah, M P; Hunt, C P (1994) Optimisation and specification of Auger electron spectrometers for signal-to-noise ratio performance. J. Electron Spectrosc. Relat. Phenom., 67. pp. 151-157.

Seah, M P (1994) Proficiency testing in surface analysis. VAM Bulletin, 11. pp. 22-24.

Seah, M P (1994) Quantitative surface analysis - detectors, repeatability and reproducibility in analogue detection. VAM Bulletin, 11. p. 36.

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) Simple method of depth profiling (stratifying) contamination layers,illustrated by studies on stainless steel. Surf. Interface Anal., 21. 336 -341

Cumpson, P J; Seah, M P (1994) Stability of reference masses I: evidence for possible variations in the mass of reference kilograms arising from mercury contamination. Metrologia, 31. 21 - 26

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) Stability of reference masses II: the effect of environment and cleaning methods on the surfaces of stainless steel and allied materials. Metrologia, 31. 93 - 108

Cumpson, P J; Seah, M P (1994) Stability of reference masses III: mechanism and long-term effects of mercury contamination on platinum-iridium mass standards. Metrologia, 31. pp. 375-388.

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) A simple method of depth profiling (stratifying) contamination layers illustrated by studies on stainless steel. Surf. Interface Anal., 21. pp. 336-341.

Seah, M P (1993) AES and XPS measurements: reducing the uncertainty and improving the accuracy. Appl. Surf. Sci., 70/71. pp. 1-8.

Seah, M P (1993) AES and XPS measurements: reducing the uncertainty and improving the accuracy. Appl. Surf. Sci., 70-71. pp. 1-8.

Seah, M P; Hunt, C (1993) Calibration of the binding energy scale of an X-ray photoelectron spectrometer. UKESCA Users Group Newsletter, 15. pp. 6-10.

Seah, M P; Hunt, C P; Tosa, M (1993) Development of a reference material and reference method to provide a calibration of the instrument intensity scale for differential AES. J. Electron Spectrosc. Relat. Phenom., 61 (2). pp. 149-171.

Seah, M P; Hunt, C P; Sykes, D*; Valeri, S*; Muller, R*; Lamb, B* (1993) Interlaboratory tests of a composite reference sample to calibrate Auger electron spectrometers in the differential mode. J. Electron Spectrosc. Relat. Phenom., 61 (2). pp. 173-182.

Seah, M P (1993) Quantitative analysis - detectors, repeatability and reproducibility. VAM Bulletin, 10. pp. 23-25.

Seah, M P (1993) Quantitative surface analysis. Spectrosc. Eur., 5. p. 40.

Laser, D; Seah, M P (1993) Reassessment of energy transfers in the quasielastic scattering of 250-3000 eV electrons at surfaces. Phys. Rev. B Condens. Matter, 47 (15). pp. 9836-9839.

Seah, M P (1993) Scattering in electron spectrometers, diagnosis and avoidance I. Concentric hemispherical analysers. Surf. Interface Anal., 20 (11). pp. 865-875.

Seah, M P (1993) Scattering in electron spectrometers, diagnosis and avoidance, I: concentric hemispherical analysers. Surf. Interface Anal., 20. pp. 865-875.

Seah, M P (1993) Scattering in electron spectrometers, diagnosis and avoidance. II. Cylindrical mirror analysers. Surf. Interface Anal., 20 (11). pp. 876-890.

Seah, M P; Cumpson, P J (1993) Signal-to-noise assessment and measurement in spectroscopies with particular reference to Auger and X-ray photoelectron spectroscopies. J. Electron Spectrosc., 61. pp. 291-308.

Seah, M P; Cumpson, P J (1993) Signal-to-noise ratio assessment and measurement in spectroscopies with particular reference to Auger and X-ray photoelectron spectroscopies. J. Electron Spectrosc. Relat. Phenom., 61 (3-4). pp. 291-308.

Seah, M P (1993) XPS reference procedure for the accurate intensity calibration of electron spectrometers: results of a BCR intercomparison co-sponsored by the VAMAS SCA TWA. Surf. Interface Anal., 20. pp. 243-266.

Seah, M P (1993) XPS: reference procedures for the accurate intensity calibration of electron spectrometers - results of a BCR intercomparison co-sponsored by the VAMAS SCA TWP. Surf. Interface Anal., 20. pp. 243-266.

Hunt, C P; Seah, M P (1992) Submonolayer adsorbate reference material based on a low alloy steel fracture sample for Auger electron spectroscopy. 1 Characteristics. Mater. Sci. Technol., 8 (11). pp. 1023-1035.

Seah, M P; Hunt, C P; Younes, C M*; Allen, G C*; Viefhaus, H*; Lee, B J*; Wild, R K*; Bishop, H E; English, T* (1992) Submonolayer adsorbate reference material based on a low alloy steel fracture sample for Auger electron spectroscopy. 2 Interlaboratory tests. Mater. Sci. Technol., 8 (11). pp. 1036-1041.

Conference or Workshop Item

Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure. In: 12th International Conference on Secondary Ion Mass Spectrometry (SIMS), September 1999, Brussels, Belgium.

Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G_SIMS procedure. In: SIMS XII Secondary Ion Mass Spectrometry, 5-10 September 1999, Brussels, Belgium.

Cumpson, P J; Seah, M P (1997) Estimation of attenuation length for film in thickness measurement in XPS and AES. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16-20 June 1997, Goteborg, Sweden.

Seah, M P; Gilmore, I S; Bishop, H E; Lorang, G (1997) Practical analyses of Intensities in AES. In: ECASIA 97, European Conference on Applications of Surface and Interface Analysis, 16 - 20 June 1997, Goteburg, Sweden.

Gilmore, I S; Seah, M P (1997) Static SIMS - a reliable technique: results from an interlaboratory study. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16 - 20 June 1997, Goteborg, Sweden.

Gilmore, I S; Seah, M P (1997) Static SIMS: an inter-laboratory study. In: 11th International Conference on Secondary Ion Mass Spectrometry, September 1997, Orlando, USA.

Seah, M P; Brown, M T (1997) Validation of software for the analysis of peak areas in XPS. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16 - 20 June 1997, Goteburg, Sweden.

Cumpson, P J; Seah, M P (1996) Contamination and cleaning of a platinum alloy: models and measurements of the build up of carbonaceous and mercury contamination. In: Proc. 6th European conference on Applications of Surface and Interface Analysis (ISBN 0471958999), May 1996.

Lorang, G*; Langeron, J P*; Seah, M P (1996) 'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as material standards for an AES data bank. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1996) An absolute high resolution digital Auger electron reference databases. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

Lorang, G*; Langeron, J P*; Seah, M P (1995) 'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as materials standards for an AES data bank. In: ECASIA 95 - European Conference on Applications of Surface and Interface Analysis, 9-13 October 1995, Monreaux, Switzerland.

Gilmore, I S; Seah, M P (1995) Static SIMS of insulators: damage and the development of measurement reliability. In: ECASIA 95 - European Conference on Applications of Surface and Interface Analysis, 9-13 October 1995, Montreaux, Switzerland.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1995) An absolute, high resolution digital auger electron reference database. In: ECASIA 95 European Conference on Applications of Surface and Interface Analysis, 9 - 13 October 1995, Montreaux, Switzerland.

Book Chapter/Section

Seah, M P; De Chiffre, L* (2006) Surface and interface characterisation. In: Springer handbook of materials measurement methods. Springer, pp. 229-280.

Seah, M P (2003) Instrument calibration for AES and XPS. In: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (eds D Briggs and J T Grant). I M Publications, pp. 167-189. ISBN 1 901019 04 7

Seah, M P (2003) Quantification in AES and XPS. In: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (eds D Briggs and J T Grant). I M Publications, pp. 345-375. ISBN 1 901019 04 7

Hondros, E D*; Seah, M P; Hofmann, S*; Lejcek, P* (1996) Interfacial and surface microchemistry. In: Physical Metallurgy (4th Edition). Elsevier Science, pp. 1201-1289.

Seah, M P (1993) Quantification in AES and XPS. In: Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics. Institute of Physics.

Seah, M P (1993) Quantification in AES and XPS. In: Quantitative microbeam analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992 (NATO Advanced Study Institute). IOP. ISBN 9780750302562

This list was generated on Wed Oct 29 10:42:45 2025 GMT.