Cumpson, P J; Seah, M P (1997) Estimation of attenuation length for film in thickness measurement in XPS and AES. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16-20 June 1997, Goteborg, Sweden.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/1640

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