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Surface and interface characterisation.

Seah, M P; De Chiffre, L* (2006) Surface and interface characterisation. In: Springer handbook of materials measurement methods. Springer, pp. 229-280.

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Abstract

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Item Type: Book Chapter/Section
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Publisher: Springer
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/4010

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