Seah, M P; De Chiffre, L* (2006) Surface and interface characterisation. In: Springer handbook of materials measurement methods. Springer, pp. 229-280.
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Item Type: | Book Chapter/Section |
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Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Publisher: | Springer |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/4010 |
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