Seah, M P; Havelund, R; Gilmore, I S (2016) Systematic temperature effects in the argon cluster ion sputter depth profiling of organic materials using secondary ion mass spectrometry. J. Am. Soc. Mass Spectrom., 27 (8). pp. 1411-1418.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1007/s13361-016-1401-5
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/7174

Actions (login required)

View Item