Gilham, R J J; Spencer, S J; Butterfield, D M; Seah, M P; Quincey, P G (2008) On the applicability of XPS for quantitative total organic and elemental carbon analysis of airborne particulate matter. Atmos. Environ., 42 (16). pp. 3888-3891.
Full text not available from this repository.Abstract
X-ray Photoelectron Spectroscopy (XPS) is a widely used surface analysis technique and in recent years, a number of groups have used XPS to analyse particulate matter collected onto filters. In this communication, XPS is compared to the standard method for determining the ratio of the total elemental carbon to total carbon in all forms in the particulates using a PM10 quartz filter sample. The results obtained from the two methods are significantly different and imply that great care should be taken when inferring particulate composition from XPS data.to total carbon using the example of a PM10 quartz filter sample. The results obtained from the two methods are significantly different and imply that great care should be taken when inferring particulate composition from XPS data.
Item Type: | Article |
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Keywords: | X-ray photoelectron spectroscopy, carbon analysis, elemental carbon, organic carbon, particulate matter, quartz filter |
Subjects: | Environmental Measurement Environmental Measurement > Atmospheric Science, Emission and Security |
Last Modified: | 02 Feb 2018 13:15 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/4129 |
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