Seah, M P; Spencer, S J (2005) Ultrathin SiO2 on Si, VII: angular accuracy in XPS and an accurate attenuation length. Surf. Interface Anal., 37. pp. 731-736.
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Item Type: | Article |
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Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3396 |
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