Seah, M P; Spencer, S J (2005) Ultrathin SiO2 on Si, VII: angular accuracy in XPS and an accurate attenuation length. Surf. Interface Anal., 37. pp. 731-736.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/3396

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