Lorang, G*; Langeron, J P*; Seah, M P (1995) 'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as materials standards for an AES data bank. In: ECASIA 95 - European Conference on Applications of Surface and Interface Analysis, 9-13 October 1995, Monreaux, Switzerland.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:19
URI:	http://eprintspublications.npl.co.uk/id/eprint/1638

Actions (login required)

View Item