Seah, M P (2004) Summary of ISO/TC 201 standard: XXI, ISO 21270:2004 - surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - linearity of intensity scale. Surf. Interface Anal., 36. pp. 1645-1646.
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Item Type: | Article |
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Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3384 |
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