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Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles

Pei, Y; Cant, D J H; Havelund, R; Stewart, M; Mingard, K; Seah, M P; Minelli, C; Shard, A G (2020) Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles. The Journal of Physical Chemistry C, 124 (43). pp. 23752-23763. ISSN 1932-7447

Full text not available from this repository.
Item Type: Article
Subjects: Nanoscience > Surface and Nanoanalysis
Divisions: Chemical & Biological Sciences
Identification number/DOI: 10.1021/acs.jpcc.0c07445
Last Modified: 23 Feb 2021 13:41
URI: http://eprintspublications.npl.co.uk/id/eprint/9051

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