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Instrument calibration for AES and XPS.

Seah, M P (2003) Instrument calibration for AES and XPS. In: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (eds D Briggs and J T Grant). I M Publications, pp. 167-189. ISBN 1 901019 04 7

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Item Type: Book Chapter/Section
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Publisher: I M Publications
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/2812

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