Seah, M P; Brown, M T (1998) Validation and accuracy of peak synthesis software for XPS. J. Electron Spectrosc. Relat. Phenom., 95 (1). pp. 71-93.

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Item Type:	Article
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/1533

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