Seah, M P; Brown, M T (1997) Validation of software for the analysis of peak areas in XPS. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16 - 20 June 1997, Goteburg, Sweden.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/1373

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