Seah, M P (1998) Procedure for measuring the repeatability of intensity scales of X-ray photoelectron spectrometers. NPL Report. CMMT(A)146

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Abstract

A procedure is provided for measuring the short and long term repeatabilities for the intensity scales of X-ray photoelectron spectrometers. The procedure is valid for all spectrometers using unmonochromated AI or Mg X-rays or monochromated AI X-rays and can be conducted in instruments equipped with an ion gun for sputter-cleaning. The procedure provides values for the short and long term repeatabilities of the intensity at low and high binding energies as well as the intensity ratio for these energies. This procedure is suitable for those conducting work within ISO 9000 or an Accreditation Scheme as well as those wising to provide valid analytical measurement. It permits the identification of faults and poor operating procedures to enable users to control and improve their measurement quality.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(A)146
Subjects:	Advanced Materials
Last Modified:	10 Sep 2018 14:03
URI:	http://eprintspublications.npl.co.uk/id/eprint/1038

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