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Resolution parameters for model functions used in surface analysis.

Seah, M P (2002) Resolution parameters for model functions used in surface analysis. Surf. Interface Anal., 33. pp. 950-953.

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Three model functions - top hat, Gaussian and Lorentzian - are used to describe peak shapes in one dimension and beam shapes in two dimensions that may be used in various surface analysis applications. Values for the full width at half-maxima and widths for selected integrated intensity intervals are calculated and tabulated as a resource to assist those using these concepts in both selecting appropriate values and to improve consistency in expressing these values between researchers. These concepts are extended to the case for AES where generalised plots are provided for estimating the effects of the intervals chosen on the resolution obtained in AES for different values of backscattering, r, and the standard deviation ratio of sr to sb.

Item Type: Article
Keywords: Auger electron spectroscopy, XPS, x-ray photoelectron spectroscopy
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/2536

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