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Quantitative XPS I: analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative XPS I: analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database. J. Electron Spectrosc. Relat. Phenom., 120 (1-3). pp. 93-111.

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Abstract

No abstract available

Item Type: Article
Keywords: databases, quantification, REELS, relative sensitivity factors, XPS
Subjects: Nanoscience
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/2505

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