Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative XPS I: analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database. J. Electron Spectrosc. Relat. Phenom., 120 (1-3). pp. 93-111.
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Item Type: | Article |
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Keywords: | databases, quantification, REELS, relative sensitivity factors, XPS |
Subjects: | Nanoscience |
Last Modified: | 02 Feb 2018 13:17 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/2505 |
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