Shard, A G; Green, F M; Brewer, P J; Seah, M P; Gilmore, I S (2008) Quantitative molecular depth profiling of organic delta-layers by C-60 ion sputtering and SIMS. J. Phys. Chem. B, 112 (9). pp. 2596-2605.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/5053

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