Seah, M P (2003) Quantification in AES and XPS. In: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (eds D Briggs and J T Grant). I M Publications, pp. 345-375. ISBN 1 901019 04 7
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Item Type: | Book Chapter/Section |
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Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Publisher: | I M Publications |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/2813 |
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