Clifford, C A; Seah, M P (2006) Interlaboratory comparison of reduced modulus measurement of polymers at the nanoscale using an AFM or a nanoindenter - protocol for analysis. NPL Report. DQL-AS 030
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Abstract
This report describes the protocol for analysis for an interlaboratory comparison of reduced modulus measurement of polymers at the nanoscale using an AFM or a Nanoindenter. Five samples are provided for this study, along with this protocol, which contains simple instructions for the analysis.
Item Type: | Report/Guide (NPL Report) |
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NPL Report No.: | DQL-AS 030 |
Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Last Modified: | 02 Feb 2018 13:15 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3521 |
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