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Imaging G-SIMS: A novel bismuth-manganese source emitter.

Green, F M; Kollmer, F*; Niehuis, E*; Gilmore, I S; Seah, M P (2008) Imaging G-SIMS: A novel bismuth-manganese source emitter. Rapid Commun. Mass Spectrom., 22 (16). pp. 2602-2608.

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G-SIMS is a powerful method that considerably simplifies complex static secondary ion mass spectrometry (SIMS) analysis of organics at surfaces. G-SIMS uses two primary ion beams that generate high and low fragmentation conditions at the surface. This allows an extrapolation to equivalent experimental conditions with very low fragmentation. Consequently, the spectra are less complex, contain more structural information and are simpler to interpret. In general, G-SIMS spectra more closely resemble electron ionisation mass spectra than SSIMS spectra. A barrier for the wider uptake of G-SIMS into the community are the requirements for two ion beams producing suitably different fragmentation conditions and the need for their registration at the surface, which is especially important for heterogeneous samples. The most popular source is the liquid metal ion source, which is now sold with almost every new ToF-SIMS instrument. Here, we have developed a novel bismuth-manganese emitter (the 'G-tip') for the popular liquid metal ion sources. This simplifies the alignment and gives excellent G-SIMS imaging and spectroscopy without significantly compromising the bismuth cluster ion beam performance.

Item Type: Article
Keywords: Static SIMS, G-SIMS, Liquid Metal Ion Source, Bismuth emitter
Subjects: Nanoscience
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4223

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