Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S (2019) Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions. Journal of The American Society for Mass Spectrometry, 30 (2). pp. 309-320. ISSN 1044-0305

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Item Type:	Article
Subjects:	Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical, Medical & Environmental Science
Identification number/DOI:	10.1007/s13361-018-2086-8
Last Modified:	16 Apr 2019 14:31
URI:	http://eprintspublications.npl.co.uk/id/eprint/8339

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