Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure. In: 12th International Conference on Secondary Ion Mass Spectrometry (SIMS), September 1999, Brussels, Belgium.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/2810

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