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A simple method of depth profiling (stratifying) contamination layers illustrated by studies on stainless steel.

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) A simple method of depth profiling (stratifying) contamination layers illustrated by studies on stainless steel. Surf. Interface Anal., 21. pp. 336-341.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:19
URI: http://eprintspublications.npl.co.uk/id/eprint/4008

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