Green, F M; Lee, J L S; Gilmore, I S; Seah, M P (2006) VAMAS 2006: static SIMS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification - protocol for anaylisis. NPL Report. DQL-AS 029

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Abstract

This report describes the protocol for analysis in the VAMAS 2006 static SIMS interlaboratory study. Procedures for setting the primary ion beam, mass analyser, ion detector and charge compensation are provided to ensure the equivalence of data between different instruments and analyser types. Three reference materials are supplied for this study, bulk PTFE, polycarbonate on silicon and a thin layer of Irganox 1010 on silicon. No sample preparation is required by the user and specific guidance is given on sample handling.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	DQL-AS 029
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/3450

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