Havelund, R; Seah, M P; Tiddia, M; Gilmore, I S (2018) SIMS of organic materials-interface location in argon gas cluster depth profiles using negative-secondary ions. Journal of the American Society for Mass Spectrometry, 29 (4). pp. 774-785.
Full text not available from this repository.Item Type: | Article |
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Subjects: | Nanoscience > Surface and Nanoanalysis |
Divisions: | Chemical, Medical & Environmental Science |
Identification number/DOI: | 10.1007/s13361-018-1905-2 |
Last Modified: | 21 Jun 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7974 |
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