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Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

Tiddia, M; Mihara, I; Seah, M P; Trindade, G F; Kollmer, F; Roberts, C J; Hague, R; Mula, G; Gilmore, I S; Havelund, R (2019) Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 11 (4). pp. 4500-4506. ISSN 1944-8244

Full text not available from this repository.
Item Type: Article
Subjects: Nanoscience > Surface and Nanoanalysis
Divisions: Chemical, Medical & Environmental Science
Identification number/DOI: 10.1021/acsami.8b15091
Last Modified: 16 Apr 2019 14:37
URI: http://eprintspublications.npl.co.uk/id/eprint/8340

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