Seah, M P (1999) Quantitative AES and XPS: convergance between theory and experimental databases. J. Electron Spectrosc. Relat. Phenom., 100. pp. 55-73.
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Item Type: | Article |
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Subjects: | Advanced Materials |
Last Modified: | 02 Feb 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1503 |
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