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XPS: Binding energy calibration of electron spectrometers 4 - Assessment of effects for different X-ray sources, analyser resolutions, angles of emmision and overall uncertainties.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: Binding energy calibration of electron spectrometers 4 - Assessment of effects for different X-ray sources, analyser resolutions, angles of emmision and overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

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Abstract

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Item Type: Article
Subjects: Advanced Materials
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/1066

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