Seah, M P (1999) Quantitative AES and XPS - convergence between theory and experimental databases. J. Electron Spectrosc., 100. pp. 55-73.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/4018

Actions (login required)

View Item