Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitive measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom., 87. pp. 159-167.

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Item Type:	Article
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/509

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