Gilmore, I S; Seah, M P (1995) Static SIMS of insulators: damage and the development of measurement reliability. In: ECASIA 95 - European Conference on Applications of Surface and Interface Analysis, 9-13 October 1995, Montreaux, Switzerland.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:19
URI:	http://eprintspublications.npl.co.uk/id/eprint/1341

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