Seah, M P (1993) XPS reference procedure for the accurate intensity calibration of electron spectrometers: results of a BCR intercomparison co-sponsored by the VAMAS SCA TWA. Surf. Interface Anal., 20. pp. 243-266.

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Item Type:	Article
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:19
URI:	http://eprintspublications.npl.co.uk/id/eprint/1733

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