Report/Guide

Skinner, J; Salter, M J; Ridler, N M; Wang, Y; Salek, M; Stake, J; Jayasankar, D; Hesler, J; Durant, S (2022) Interlaboratory Comparison Of S-Parameter Measurements In WM-380 Waveguide at Frequencies from 500 GHz to 750 GHz. NPL Report. TQE 23

Skinner, J A; Salter, M J; Ridler, N M; Wang, Y; Salek, M; Martens, J; Hesler, J; Durants, S (2022) Interlaboratory Comparison of S-parameter Measurements IN WM-570 Waveguide at Frequencies from 325 GHz to 500 GHz. NPL Report. TQE 24

Singh, D; Salter, M; Skinner, J; Ridler, N M (2021) Commissioning of a VNA dynamic uncertainty tool for microwave S-parameter measurements. NPL Report. TQE 16

Shang, X; Ridler, N M; Ding, J; Geen, M (2021) Introductory guide to making planar S-parameter measurements at millimetre-wave frequencies. Other. National Physical Laboratory.

Singh, D; Salter, M; Ridler, N M (2019) Comparison of Vector Network Analyser (VNA) calibration techniques at microwave frequencies. NPL Report. TQE 14

Shoaib, N; Ridler, N M; Salter, M J (2015) Commissioning of the NPL WR-05 waveguide network analyser system for S-parameter measurements from 140 GHz to 220 GHz. NPL Report. TQE 12

Ridler, N M (2009) Choosing line lengths for calibrating waveguide vector network analysers at millimetre and sub-millimetre wavelengths. NPL Report. TQE 5

Wickham, M; Salter, M; Ridler, N M; Dusek, M; Hunt, C (2008) On-wafer testing of PCB lines as a production assessment method for anisotropic conductive film bonding. NPL Report. MAT 18

Ridler, N M; Salter, M J; Fletcher, S H (2004) Comparison of type-N coaxial power splitter measurements from 1 GHz to 18 GHz. Technical Report.

Cox, M G; Esward, T J; Harris, P M; McCormick, N J; Ridler, N M; Salter, M J; Walton, J P R B* (2004) Visualization of uncertainty associated with classes of electrical measurements. NPL Report. CMSC 44/04

Ridler, N M; Morgan, A G (2003) ANAMET-032 : 'Live' dial gauge measurement investigation using type-N connectors. Technical Report. NPL, UK.

Maddock, M J*; Ridler, N M (2001) ANAMET-991: TDNA measurement comparison exercise. Technical Report.

Ridler, N M (2000) Converting between logarithmic and linear formats for reflection and transmission coefficients. Part 2: when uncertainty of measurement is relatively large. Technical Report.

Ridler, N M (2000) Converting between logarithmic and linear formats for reflection and transmission coefficients. Technical Report.

Salter, M J; Ridler, N M; Cox, M G (2000) Distribution of correlation coefficient for samples taken from a bivariate normal distribution. NPL Report. CETM 22

Morgan, A G*; Ridler, N M (2000) Investigating the effects of interchanging components used to perform 'ripple' assessments on calibrated vector network analysers. Technical Report.

Adamson, D B; Ridler, N M (2000) Information on some popular waveguide sizes. Technical Report.

Ridler, N M; Woolliams, P D (2000) Tips on using coaxial connector torque spanners. Technical Report.

Ridler, N M; Smith, A J A (1999) Gauge compatibility for the smaller coaxial line sizes. Technical Report.

Cox, M G; Dainton, M; Harris, P M; Ridler, N M; Young, P R (1999) A generalised treatment of the uncertainty in calibration and measurement of vector-indicating microwave reflectometers. NPL Report. CETM 10

Ridler, N M (1999) A comparison of complex scattering coefficient measurements of coaxial-to-waveguide adaptors. NPL Report. CEM 6

Ridler, N M; Graham, C (1998) An investigation into the variation of torque values obtained using coaxial connector torque spanners. Technical Report.

Ridler, N M (1998) Coverage factors and levels of confidence for vector ANA measurements. Technical Report.

Ridler, N M; Medley, J C (1997) Improvements to traceability for impedance measurements at RF in the UK. Technical Report.

Ridler, N M; Medley, J C (1997) ANAMET-971: "live" investigation into variation in ANA measurements due to different calibration loads. Technical Report.

Ridler, N M (1997) ANAMET. The collected ANAlyse notes - Volume 2, numbers 11 to 20. NPL Report. CETM 8

Ridler, N M; Medley, J C (1997) Live dial gauge comparison exercise: ANAMET-963. Technical Report.

Ridler, N M (1997) ANAMET measurement compaisons 931, 942 and 951. Technical Report.

Ridler, N M; Medley, J C (1997) The ANAMET data analysis game. Technical Report.

Ridler, N M (1996) The uncertainty in the median. Technical Report.

Clarke, R N; Ide, J P; Orford, G R; Ridler, N M (1996) Draft EAL procedure for the assessment of vector network analysers (VNA). Technical Report.

Medley, J C; Ridler, N M (1996) ANAMET 962 dial gauge comparison exercise. Technical Report.

Medley, J C; Ridler, N M (1996) Assessing the quality of an estimated value - Part 2: the median absolute deviation. Technical Report.

Ridler, N M; Medley, J C (1996) Making a good estimate of a vector quantity. Technical Report.

Ridler, N M (1996) How much variation should we expect from coaxial connector dial gauge measurements. Technical Report.

Ridler, N M (1996) New words for new ideas - a look at some of the terminology recommended for expressing measurement uncertainty. Technical Report.

Ridler, N M (1995) The collected ANAlyse notes, Volume 1 - numbers 1 to 10. NPL Report. DES 140

Ridler, N M; Medley, J C (1995) A comparison of complex scattering coefficient measurements in 50ohm coaxial line to 26.5GHz. NPL Report. DES 138

Ridler, N M (1995) Assessing the quality of an estimated value. Technical Report.

Ridler, N M (1995) Making a good estimate of a measurand. Technical Report.

Ridler, N M (1993) VHF impedance measurement - a review. NPL Report. DES 127

Article

Gruber, M; Skinner, J; Eichstadt, S; Appleby, R; Ridler, N M (2025) Enabling efficient uncertainty evaluation of time-gating implemented in an open-source python package. Measurement: Sensors, 38. 101738

Shang, X; Naftaly, M; Skinner, J; Ausden, L; Gregory, A; Ridler, N M; Arz, U; Phung, G N; Ulm, D; Kleine-Ostmann, T; Allal, D; Wojciechowski, M; Kazemipour, A; Gaumann, G; Hudlicka, M (2024) Interlaboratory Comparison of Dielectric Measurements from Microwave to Terahertz Frequencies Using VNA-based and Optical-based Methods. IEEE Transactions on Microwave Theory and Techniques, 72 (11). pp. 6473-6484.

Shin, S-H; Stanley, M; Wong, W N; Sweetnam, T; Elarabi, A; Lindstrom, T; Ridler, N M; de Graaf, S (2024) In-operando microwave scattering-parameter calibrated measurement of a Josephson travelling wave parametric amplifier. Applied Physics Letters, 125 (10). 104001

Skinner, J; Gruber, M; Eichstadt, S; Appleby, R; Ridler, N M (2024) Uncertainty propagation for microwave scattering parameter measurements subject to time-domain and time-gating transformations. Measurement, 235. 114891

Stanley, M; Shang, X; Celep, M; Salter, M; de Graaf, S; Lindstrom, T; Shin, S-H; Skinner, J; Singh, D; Stokes, D; Acharya, M; Ridler, N M (2024) RF and Microwave Metrology for Quantum Computing – Recent Developments at the UK’s National Physical Laboratory. International Journal of Microwave and Wireless Technologies, 16 (4). pp. 535-543.

Shin, S-H; Stanley, M; Skinner, J; de Graaf, S E; Ridler, N M (2024) Broadband Coaxial S-parameter Measurements for Cryogenic Quantum Technologies. IEEE Transactions on Microwave Theory and Techniques, 72 (4). pp. 2193-2201. (Submitted)

Stanley, M; Salter, M; Urbonas, J; Skinner, J; Shin, S-H; de Graaf, S; Ridler, N M (2024) Characterizing S-Parameters of Microwave Coaxial Devices with up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications. IEEE Transactions on Instrumentation and Measurement, 73. 1500906

Shu, M; Shang, X; Ridler, N M; Calleau, A R; Dimitriadis, A I; Zhang, A (2024) Improvements to Millimeter-wave Dielectric Measurement Using Material Characterization Kit (MCK). IEEE Transactions on Instrumentation and Measurement, 73. 6001108

Shang, X; Ridler, N M; Stokes, D; Skinner, J; Mubarak, F; Arz, U; Phung, G N; Kuhlmann, K; Kazemipour, A; Hudlicka, M; Ziade, F (2024) Some Recent Advancements in Measurements at Millimeter-wave and Terahertz Frequencies: Advanced in High Frequency Measurements. IEEE Microwave Magazine, 25 (1). pp. 58-71.

Skinner, J; Ridler, N M; Miller, N; Brokenshire, S; Bayley, N; Young, P (2023) Benchmarking Seamless Sub-mmWave and Terahertz Rectangular Metallic Waveguide. Microwave Journal, 66 (11). pp. 60-68.

Zhu, L; Shin, S-H; Payapulli, R; Rossuck, I W; Klein, N; Ridler, N M; Lucyszyn, S (2023) 3-D Printed THz Waveguide Components. IEEE Access, 11. pp. 79073-79086.

Stanley, M; Parker-Jervis, R; Skinner, J; de Graaf, S; Lindstrom, T; Cunningham, J E; Ridler, N M (2023) Determination of the Permittivity of Transmission Lines at Milli-kelvin Temperatures. IEEE Access, 11. pp. 60626-60634.

Zhu, L; Shin, S H; Payapulli, R; Machii, T; Motoyoshi, M; Suematsu, N; Ridler, N M; Lucyszyn, S (2023) 3-D Printed Rectangular Waveguide 123–129 GHz Packaging for Commercial CMOS RFICs. IEEE Microwave and Wireless Technology, 33 (2). pp. 157-160.

Stokes, D; Liu, Y; Shang, X; Ridler, N M (2023) Millimeter-wave and terahertz power meter characterisation at W-band frequencies. Journal of Infrared, Millimeter and Terahertz Waves, 44. pp. 134-150.

Singh, D; Salter, M J; Johny, S; Ridler, N M (2022) Uncertainties in small-signal and large-signal measurements of RF amplifiers using a VNA. IEEE Instrumentation & Measurement Magazine, 25 (6). pp. 37-44.

Stanley, M; Parker-Jervis, R; de Graaf, S; Lindstrom, T; Cunningham, J E; Ridler, N M (2022) Validating S-parameters measurement of RF integrated circuits at milli-kelvin temperatures. Electronics Letters, 58 (16). pp. 614-616.

Shin, S H; Payapulli, R; Zhu, L; Stanley, M; Shang, X; Ridler, N M; Lucyszyn, S (2022) 3-D Printed Plug and Play Prototyping for Low-Cost Sub-THz Subsystems. IEEE Access, 10. pp. 41708-41719.

Stanley, M; de Graaf, S; Honigl-Decrinis, T; Lindstrom, T; Ridler, N M (2022) Characterizing Scattering Parameters of Superconducting Quantum Integrated Circuits at Milli-Kelvin Temperatures. IEEE Access, 10. pp. 43376-43386.

Marquez-Segura, E; Shin, S H; Dawood, A; Ridler, N M; Lucyszyn, S (2021) Microwave Characterization of Conductive PLA and Its Application to a 12 to 18 GHz 3-D Printed Rotary Vane Attenuator. IEEE Access, 9. pp. 84327-84343.

Collier, R J; Ridler, N M; Young, P R (2021) The effect of standing waves on the attenuation constant for a low‐loss rectangular waveguide. Electronics Letters, 57 (9). pp. 366-368. ISSN 0013-5194

Ma, D; Shang, X; Ridler, N M; Wu, W (2021) Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies. IEEE Transactions on Instrumentation and Measurement, 70. 6005904

Ridler, N M; Johny, S; Salter, M J; Shang, X; Sun, W; Wilson, A (2021) Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths. Metrologia, 58 (1). 015015 ISSN 0026-1394

Shin, S H; Shang, X; Ridler, N M; Lucyszyn, S (2021) Polymer-Based 3-D Printed 140-220 GHz Low-Cost Quasi-Optical Components and Integrated Subsystem Assembly. IEEE Access, 9. pp. 28020-28038. ISSN 2169-3536

Koo, H; Salter, M; Kang, N W; Ridler, N M; Hong, Y P (2021) Uncertainty of S-parameter Measurements on PCBs due to Imperfections in the TRL Line Standard. Journal of Electromagnetic Engineering and Science, 21 (5). pp. 369-378.

Ridler, N M; Johny, S; Shang, X; Sun, W; Wilson, A (2020) Comparing Standardized and Manufacturers’ Interfaces for Waveguides Used at Submillimeter Wavelengths. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 453-459. ISSN 2156-342X

Wang, Y; Shang, X; Ridler, N M; Naftaly, M; Dimitriadis, A I; Huang, T; Wu, W (2020) Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 466-473. ISSN 2156-342X

Jones, A; Lucyszyn, S; Márquez-Segura, E; Ridler, N M; Skinner, J; Stokes, D (2020) 3-D printed primary standards for calibration of microwave network analysers. Measurement, 158. 107682 ISSN 02632241

Wang, Y; Shang, X; Ridler, N M; Huang, T; Wu, W (2020) Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique. IEEE Transactions on Instrumentation and Measurement, 69 (7). pp. 4930-4939. ISSN 0018-9456

Lozar, R; Ohlrogge, M; Weber, R; Ridler, N M; Shang, X B; Probst, T; Arz, U (2019) A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies. IEEE Transactions on Microwave Theory and Techniques, 67 (8). pp. 3475-3484. ISSN 0018-9480

Shin, S H; Alyasiri, D F; D'Auria, M; Otter, W J; Myant, C W; Stokes, D; Tian, Z R; Ridler, N M; Lucyszyn, S (2019) Polymer-Based 3-D Printed Ku-Band Steerable Phased-Array Antenna Subsystem. IEEE Access, 7. pp. 106662-106673. ISSN 2169-3536

Sun, J Y; Dawood, A; Otter, W J; Ridler, N M; Lucyszyn, S (2019) Microwave Characterization of Low-Loss FDM 3-D Printed ABS With Dielectric-Filled Metal-Pipe Rectangular Waveguide Spectroscopy. IEEE Access, 7. pp. 95455-95486. ISSN 2169-3536

Ridler, N M; Clarke, R G; Li, C; Salter, M J (2019) Strategies for Traceable Submillimeter-Wave Vector Network Analyzer. IEEE Transactions on Terahertz Science and Technology, 9 (4). pp. 392-398. ISSN 2156-342X

Stant, L T; Salter, M J; Ridler, N M; Williams, D F; Aaen, P H (2019) Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models. IEEE Transactions on Microwave Theory and Techniques, 67 (2). pp. 815-821. ISSN 0018-9480

Azeez, Y F; Collier, R J; Ridler, N M; Young, P R (2019) Establishing a New Form of Primary Impedance Standard at Millimeter-Wave Frequencies. IEEE Transactions on Instrumentation and Measurement, 68 (1). pp. 294-296. ISSN 0018-9456

Zhou, J F; Ridler, N M; Shen, Y C; Huang, Y (2018) Guest Editorial: Selected papers from the 10th UK-Europe-China Workshop on Millimetre-waves and Terahertz Technologies (UCMMT). IET Microwaves, Antennas & Propagation, 12 (11). pp. 1745-1747. ISSN 1751-8725

Liu, C; Wu, A; Li, C; Ridler, N M (2018) A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model. IEEE Transactions on Microwave Theory and Techniques, 66 (8). pp. 3894-3900. ISSN 0018-9480

Votsi, H; Li, C; Aaen, P; Ridler, N M (2017) An active interferometric method for extreme impedance on-wafer device measurements. IEEE Microwave and Wireless Components Letters, 27 (11). pp. 1034-1036.

Dhillon, S S*; Vitiello, M S*; Linfield, E H*; Davies, A G*; Hoffmann, M C*; Booske, J*; Paoloni, C*; Gensch, M*; Weightman, P*; Williams, G P*; Castro-Camus, E*; Cumming, D R S*; Simoens, F*; Escorcia-Carranza, I*; Grant, J*; Lucyszyn, S*; Kuwata-Gonokami, M*; Konishi, K*; Koch, M*; Schmuttermaer, C A*; Cocker, T L*; Huber, R*; Markelz, A G*; Taylor, Z D*; Wallace, V P*; Zeitler, J A*; Sibik, J*; Korter, T M*; Ellison, B*; Rea, S*; Goldsmith, P*; Cooper, K B*; Appleby, R*; Pardo, D*; Huggard, P G*; Krozer, V*; Shams, H*; Fice, M*; Renaud, C*; Seeds, A*; Stohr, A*; Naftaly, M; Ridler, N M; Clarke, R*; Cunningham, J E*; Johnston, M B* (2017) The 2017 terahertz science and technology roadmap. J. Phys. D, Appl. Phys., 50 (4). 043001

Otter, W J*; Ridler, N M; Yasukochi, H*; Soeda, K*; Konishi, K*; Yumoto, J*; Kuwata-Gonokami, M*; Lucyszyn, S* (2017) 3D printed 1.1 THz waveguides. Electron. Lett., 53 (7). pp. 471-473.

Aaen, P H*; Ridler, N M (2017) ARFTG 2017. IEEE Microw. Mag., 18 (3). pp. 98-100.

Stant, L*; Aaen, P*; Ridler, N M (2017) Evaluating residual errors in waveguide VNAs from microwave to submillimetre-wave frequencies. IET Microw. Antennas Propag., 11 (3). pp. 324-329.

Naftaly, M; Clarke, R G*; Humphreys, D A; Ridler, N M (2017) Metrology state-of-the-art and challenges in braodband phase-sensitive terahertz measurements. Proc. IEEE, 105 (6). pp. 1151-1165.

Gillatt, B T W*; D'Auria, M*; Otter, W J*; Ridler, N M; Lucyszyn, S* (2016) 3-D printed variable phase shifter. IEEE Microw. Wirel. Compon. Lett., 26 (10). pp. 822-824.

Stant, L T*; Aaen, P H*; Ridler, N M (2016) Comparing methods for evaluating measurement uncertainty given in the JCGM 'Evaluation of Measurement Data' documents. Measurement, 94. pp. 847-851.

Ridler, N M; Clarke, R G* (2016) Establishing traceability to the international system of units for scattering parameter measurements from 750 GHz to 1.1 THz. IEEE Trans. Terahertz Sci. Technol., 6 (1). pp. 2-11.

Ridler, N M; Clarke, R N; Huang, H*; Zinal, S* (2016) Evaluation of cross-connected waveguides as transfer standards of transmission at high millimetre-wave frequencies. Metrologia, 53 (4). pp. 1069-1078.

Naftaly, M; Shoaib, N*; Stokes, D*; Ridler, N M (2016) Intercomparison of terahertz dielectric measurements using vector network analyzer and time-domain spectrometer. J. Infrared Millim. Terahertz Waves, 37 (7). pp. 691-702.

Ridler, N M (2016) The MTT-S standards coordinating committee- developing IEEE standards. IEEE Microw. Mag., 17 (9). p. 82.

D'Auria, M*; Otter, W J*; Hazell, J*; Gillatt, B T W*; Long-Collins, C*; Ridler, N M; Lucyszyn, S* (2015) 3D printed metall pipe rectangular waveguide. IEEE Trans. Compon. Packag. Manuf. Technol., 5 (9). pp. 1339-1349.

Blackham, D*; Ridler, N M; Sayed, M*; Cable, J* (2015) ARFTG May 2015. IEEE Microw. Mag., 16 (3). pp. 58-59.

Otter, W J*; Hanham, S M*; Ridler, N M; Marino, G*; Klein, N*; Lucyszyn, S* (2014) 100 GHz ultra-high Q-factor photonic crystal resonators. Sens. Actuators A, Phys., 217. pp. 151-159.

Ridler, N M; Salter, M J (2014) Evaluating and expressing uncertainty in high-frequency electromagnetic measurements: a selective review. Metrologia, 51 (4). S191-S198

Ridler, N M; Salter, M J (2014) Evaluating and expressing uncertainty in high-frequency electromagnetic measurements: a selective review. Metrologia, 51 (4). S191-S198

Papantonis, S*; Ridler, N M; Wilson, A*; Lucyszyn, S* (2014) Reconfigurable waveguide for vector network analyzer verification. IEEE Trans. Microw. Theory Tech., 62 (10). pp. 2415-2422.

Papantonis, S*; Ridler, N M; Lucyszyn, S* (2014) Rectangular waveguide enabling technology using holey surfaces and wire media metamaterials. Sens. Actuators A, Phys., 209. pp. 1-8.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2013) The trace is on measurements: developing traceability for S-parameter measurements at millimeter and submillimeter wavelengths. IEEE Microw. Mag., 14 (7). pp. 67-74.

Ridler, N M; Shelton, D J* (2012) Determining the high-frequency resistivity of slightly lossy coaxial air lines. Metrologia, 49 (6). pp. 644-650.

Horibe, M*; Ridler, N M (2011) Comparison between NPL and NMIJ of diameter and scattering parameter measurements of precision 1.85 mm coaxial air lines. IEEE Trans. Instrum. Meas., 60 (7). pp. 2327-2334.

Ridler, N M; Ginley, R A* (2011) IEEE P1785 - a new standard for waveguide above 110 GHz. Microw. J., 54 (3 - Su). p. 20.

Horibe, M*; Ridler, N M (2009) Comparison between two National Metrology Institutes of diameters and characteristic impedance of coaxial air lines. IEEE Trans. Instrum. Meas., 58 (4). pp. 1084-1089.

Ridler, N M; Morgan, A G (2008) New primary reference standard for vector network analyser calibration at millimetre wavelengths in coaxial line. Meas. Sci. Technol., 19 (6). 065103

Ridler, N M (2007) Evaluate accuracy of portable VNAs. Microw. RF, 46 (1). pp. 58-68.

Eio, C P; Protheroe, S; Ridler, N M (2006) Characterising beadless air lines as reference artefacts for S-parameter measurements at RF and microwave frequencies. IEE Proc. Sci. Meas. Technol., 153 (6). pp. 229-234.

Yip, J G M; Ridler, N M; Collier, R J*; Lee, M-H J* (2006) Traceable high-precision impedance measurements for the millimetre-wave band using dielectric waveguide transmission lines. IEE Proc. Sci. Meas. Technol., 153 (6). pp. 235-240.

Morgan, A G; Ridler, N M; Salter, M J (2003) Generalized adaptive calibration schemes for precision RF network analyser measurements. IEEE Trans. Instrum. Meas., 52 (4). pp. 1266-1272.

Cox, M G; Dainton, M P; Ridler, N M; Salter, M J; Young, P R (2003) An Interpolation scheme for precision intermediate frequency reflection coefficient measurement. IEEE Trans. Instrum. Meas., 52 (1). pp. 27-37.

Dudley, R A; Ridler, N M (2003) Traceability via the Internet for microwave measurements using vector network analysers. IEEE Trans. Instrum. Meas., 52 (1). pp. 130-134.

Ridler, N M (2002) Calibrate VNAs over the internet. Test Meas. World, 22 (7). 39-40, 43

Ridler, N M; Salter, M J (2002) An approach to the treatment of uncertainty in complex S-parameter measurements. Metrologia, 39 (3). pp. 295-302.

Dudley, R A; Ridler, N M (2000) Calibration over the internet. Qual. Today (May). s12-s14

Dudley, R A; Ridler, N M; Williams, J M (2000) Internet-based calibrations of electrical quantities at UK's National Physical Laboratory. CalLab Mag., 7 (6). pp. 22-25.

French, G; Ridler, N M (1999) A primary national standard millimetric waveguide S-parameter measurements. Microw. Eng. Eur. (Octobe). pp. 29-32.

Ridler, N M (1999) A review of existing national measurement standards for RF and microwave impedance parameters in the UK. IEE Colloq. Dig., 0008. pp. 6/1-6.

Ridler, N M; Medley, J C (1997) Improvements to traceability for impedance measurements at RF in the UK. IEE Engineering, Science and Education Journal, 6 (1). pp. 17-24.

Ridler, N M (1996) Evaluating the uncertainty in measurements - general principles. IEE Colloq. Dig. (No. 96). 1/1-1/4

Ridler, N M; Medley, J C (1996) Improving the traceability of coaxial impedance measurements at lower RF in the UK. IEE Proc. Sci. Meas. Technol., 143 (4). pp. 241-245.

Ridler, N M; Jones, G D (1995) Comparison assesses the quality of network measurements. Microw. RF, 34 (1). 101 - 102

Ridler, N M (1995) Project group on measurement uncertainty in testing. EUROLAB Newsletter (27). pp. 7-8.

Ridler, N M; Medley, J C (1994) New technique checks accuracy of impedance measurements. Microw. RF, 33 (1). 105 - 106

Ridler, N M (1994) Progress towards documentation for uncertainty practices in testing. EUROLAB Newsletter (9.5). p. 5.

Ridler, N M; Medley, J C (1994) Traceable reflection coefficient measurements in coaxial line at MF and HF. IEE Colloq. Dig., 042. 8/1-8/4

Ridler, N M (1994) A new VHF impedance measuring instrument for the United Kingdom's national standard. IEE Proc. Sci. Meas. Technol., 141 (1). pp. 71-74.

Ridler, N M (1993) Improved RF calibration techniques for network analysers and reflectometers. Microw. Eng. Eur. (Octobe). pp. 35-39.

Ridler, N M (1993) Uncertainty estimation in testing. Qual. Today (Septem). S19.

Conference or Workshop Item

Ausden, L; Stokes, D; Skinner, J; Ridler, N M; Shang, X (2024) Characterisation of Dielectric Substrates at Millimetre-wave and Sub-terahertz Frequencies Using a VNA-based Guided-wave Technique. In: 54th European Microwave Conference, 24-26 September 2024, Paris, France.

Shang, X; Shu, M; Naftaly, M; Ridler, N M; Hanham, S M (2024) Characterization of Dielectric Materials at WM-380 Band (500 - 750 GHz) Using Three Broadband Measurement Techniques. In: 2024 103rd ARFTG Microwave Measurement Conference (ARFTG), 21 June 2024, Washington DC, USA.

Skinner, J; Ridler, N M (2024) Experimental Determination of the Internal Aperture Dimensions of Sub-Terahertz Waveguides. In: 2024 103rd ARFTG Microwave Measurement Conference (ARFTG), 21 June 2024, Washington DC, USA.

Celep, M; Shin, S; Stanley, M; Breakenridge, E; Singh, S; Ridler, N M (2024) SI Traceable RF and Microwave Power Measurements at Cryogenic Temperatures. In: 2024 Conference on Precision Electromagnetic Measurement (CPEM), 08-12 July 2024, Denver, CO, USA.

Skinner, J; Campion, J; Ridler, N M (2023) Comparison of TRL Calibration Standards and Techniques for Waveguide S-parameter Measurements up to Terahertz Frequencies. In: 2023 53rd European Microwave Conference (EcMC), 19-21 September 2023, Berlin, Germany.

Shang, X; Ridler, N M; Arz, U; Phung, G N; Roch-Jeune, I; Ducournau, G; Haddadi, K; Flisgen, T; Doerner, R; Allal, D; Jayasankar, D; Stake, J; Schmidt, R; Fisher, G (2023) Interlaboratory Investigation of On-wafer S parameter Measurements from 110 GHz to 1.1 THz. In: 2023 53rd European Microwave Conference (EcMC), 19-21 September 2023, Berlin, Germany.

Kazim, J R; Ali, M Z; Al-Moathin, A; Nikbakhtnasrabadi, F; Khatri, P; Powell, M; Stanley, M; Ridler, N M; Rossi, A; Weides, M; Heidari, H; Imran, M A; Abbasi, Q H; Li, C (2023) Wireless Microwave Signal Transmission for Cryogenic Applications. In: 2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI), 23-28 July 2023, Portland, OR USA.

Stanley, M; de Graaf, S; Lindstrom, T; Salter, M; Skinner, J; Ridler, N M (2023) Design of Microwave Calibration Standards for Characterising S-Parameters of Quantum Integrated Circuits at Millikelvin Temperatures. In: 2021 51st European Microwave Conference (EuMC), 04-06 April 2022, London, UK.

Shu, M; Shang, X; Ridler, N M; Naftaly, M; Guo, C; Zhang, A (2022) Characterisation of dielectric materials at G-band (140-220 GHz) using a guided free-space technique. In: 2022 52nd European Microwave Conference (EuMC), 27 - 29 September 2022, Milan, Italy.

Ding, J; Shang, X; Buck, C; Geen, M; Ridler, N M (2022) Low-Loss 140-175 GHz MMIC-to-Waveguide Transitions and MMIC-to-MMIC Interconnections. In: 2021 51st European Microwave Conference (EuMC), 04-06 April 2022, London, UK.

Votsi, H; Stant, L T; Matei, C; Salter, M J; Li, C; Ridler, N M; Aaen, P H (2020) An Interferometric Characterization Technique for Extreme Impedance Microwave Devices. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.

Clarke, R G; Shang, X; Ridler, N M; Lozar, R; Probst, T; Arz, U (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.

Shang, X B; Ridler, N M; Sun, W J; Cooper, P; Wilson, A (2019) Preliminary Study on WM-380 Waveguide TRL Calibration Line Standards at the UK's National Physical Laboratory. In: 2019 92nd ARFTG Microwave Measurement Conference (ARFTG), 19-22 January 2019, Orlando, Fl, USA.

Lucyszyn, S; Shang, X; Otter, W J; Myant, C W; Cheng, R; Ridler, N M (2018) Polymer-based 3D Printed Millimeter-wave Components for Spacecraft Payloads. In: 2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), 16-18 July 2018, Ann Arbor, MI, USA.

Clarke, R G; Li, C; Ridler, N M (2017) An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies. In: 2017 90th ARFTG Microwave Measurement Symposium (ARFTG), 28 November 2017 - 01 December 2017, Boulder, CO, USA.

Ridler, N M; Li, C (2017) Benchmarking electrical loss in rectangular metallic waveguide at submillimeter wavelengths. In: 2017 10th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT), 11-13 Septemeber 2017, Liverpool, UK.

Ridler, N M; Ginleyt, R A (2017) A review of the IEEE 1785 standards for rectangular waveguides above 110 GHz. In: 2017 89th ARFTG Microwave Measurement Conference (ARFTG), 9 June 2017, Honololu, Hawaii, USA.

Votsi, H*; Roch-Jeune, I*; Haddadi, K*; Li, C*; Dambrine, G*; Aaen, P H*; Ridler, N M (2016) Development of a reference wafer for on-wafer testing of extreme impedance devices. In: 88th ARFTG Microwave Measurement Conference (ARFTG), 8-9 December 2016, Austin, Tx, USA.

Khalid, A*; Cummings, D*; Clarke, R*; Li, C*; Ridler, N M (2016) Evaluation of a VNA-based materials characterization kit at frequencies from 0.75 THz to 1.1 THz. In: 2016 IEEE 9th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT), 5-7 September 2016, Qingdao, China.

Mubarak, F*; Zeier, M*; Hoffmann, J*; Ridler, N M; Salter, M J; Kuhlmann, K* (2016) Verification concepts in S-parameter measurements,. In: 2016 Conference on Precision Electromagnetic Measurements (CPEM), 10-15 July 2016, Ottawa, Canada.

Naftaly, M; Ridler, N M; Molloy, J F; Shoaib, N*; Stokes, D* (2015) A comparison method for THz measurements using VNA and TDS. In: 40th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 23-28 August 2015, Hong Kong.

Ridler, N M; Salter, M J (2015) Analyzing uncertainty matrices associated with multiple S-parameter measurements. In: 85th ARFTG Microwave Measurement Conference Proceedings, 22 May 2015, Phoenix, Az, USA.

Ridler, N M; Clarke, R G* (2014) Evaluating the effect of using precision alignment dowels on connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz. In: 84th ARFTG Microwave Measurement Conference, 4-5 December 2014, Boulder, CO, USA.

Huang, H*; Ridler, N M; Salter, M J (2014) Connection repeatability of cross-connected waveguide verification standards for millimeter wave vector network analysis. In: 2014 Proceedings of Asia-Pacific Microwave Conference, 4-7 November 2014, Sendai, Japan.

Salter, M J; Ridler, N M (2014) Use of reduced aperture waveguide as a calculable standard for the verification of millimetre-wave vector network analyzers. In: 44th European Microwave Conference Proceedings (EuMC), 6-9 October 2014, Rome, Italy.

Ridler, N M; Clarke, R G* (2014) Further investigations into connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz. In: 83rd ARFTG Measurement Conference, 6 June 2014, Tampa, Fl, USA.

Hui Huang*,; Ridler, N M; Salter, M J (2014) Using electromagnetic modelling to evaluate uncertainty in a millimeter-wave cross-guide verification standard. In: 83rd ARFTG Microwave Conference, 6 June 2014, Tampa, Fl, USA.

Papantonis, S*; Ridler, N M; Lucyszyn, S* (2013) A new technique for vector network analyzer verification using a single reconfigurable device. In: 82nd ARFTG Microwave Measurement Conference, 18-21 November 2013, Columbus, OH, USA.

Ridler, N M; Salter, M J (2013) Cross-connected waveguide lines as standards for millimeter- and submillimeter-wave vector network analyzers. In: 81st ARFTG Microwave Measurement Conference (ARFTG) 2013, 7 June 2013, Seattle, Washington, USA.

Shelton, D*; Salter, M; Ridler, N M; Horibe, M* (2012) Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies. In: 80th ARFTG Microwave Measurement Conference, 29-30 November 2012, San Diego, CA, USA.

Shelton, D*; Salter, M; Ridler, N M; Horibe, M* (2012) Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies. In: 2012 80th ARFTG Microwave Measurement Conference, 29-30 November 2012, San Diego, CA, USA.

Horibe, M*; Ridler, N M; Wilson, A (2012) Traceability via precision dimensional measurements of WM-864 (WR-03) waveguide standard shims including comparison between NPL and NMIJ. In: 79th ARFTG Microwave Measurement Conference, 22 June 2012, Montreal, Canada.

Barr, J*; Hunter, I*; Boglione, L*; McKinney, J K*; Ward-Callan, *; Ridler, N M; Komrji, H* (2012) Remembering Roger Pollard. In: 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012, 17-22 June 2012, Montreal, Canada.

Ridler, N M; Ginley, R A* (2012) Standardizing rectangular metallic waveguides for terahertz applications. In: 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012), 1-6 July 2012, Washington DC, USA.

Harper, M R; Ridler, N M; Salter, M J (2012) A proposed standard for loss measurements on printed circuit boards. In: Proceedings of the 3rd Annual Seminar on Passive RF and Microwave Components., 26 March 2012, London, UK.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2011) Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz. In: 78th ARFTG Microwave Measurement Symposium, 1 - 2 December 2011, Tempe, AZ, USA.

Adamson, D B; Howes, J; Ridler, N M (2009) Recent and future developments in millimetre and sub-millimetre wavelength measurement standards at NPL. In: Proceedings of the Joint 5th ESA Workshop on Millimetre Wave Technology and Applications and 31st ESA Antenna Workshop, 18-20 May 2009, Noordwijk, The Netherlands.

Ridler, N M (2009) Recommendations for waveguide sizes at submillimeter wavelengths. In: 73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, USA.

Ridler, N M; Salter, M J; Wilson, A; Pollard, R*; Clarke, R* (2009) Traceability to National Standards for S parameter measurements of waveguide devices from 110 GHz to 170 GHz. In: 73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, USA.

Salter, M J; Harper, M R; Ridler, N M (2008) Comparison between root-impulse-energy and vector network analyzer methods for measuring loss on printed circuit boards. In: 72nd ARFTG Microwave Measurement Conference Digest, 9-12 December 2008, Portland, OR, USA.

de Vreede, J P M*; Ridler, N M (2006) Beadless air lines as phase standards. In: CPEM 2006 Conference on Precision Electromagnetic Measurements, 9-14 July 2006, Torino, Italy.

de Vreede, J P M*; Ridler, N M (2006) Beadless air lines as phase standards. In: CPEM 2006 Conference on Precision Electromagnetic Measurements, 9-14 July 2006, Torino, Italy.

Yip, J G M; Collier, R J*; Ridler, N M (2006) New impedance measurement system using dielectric waveguide for the millimetre-wave region. In: CPEM 2006 Conference on Precision Electromagnetic Measurements, 9-14 July 2006, Torino, Italy.

Yip, J G M; Collier, R J*; Ridler, N M (2006) New impedance measurement system using dielectric waveguide for the millimetre-wave region. In: CPEM 2006 Conference on Precision Electromagnetic Measurements, 9-14 July 2006, Torino, Italy.

Eio, C P; Ridler, N M (2005) Characterising air lines using VNA loss measurements. In: BEMC 2005 - British Electromagnetic Measurements Conference, 14-17 November 2005, NPL, UK.

Yip, J G M; Lee, M-H J*; Ridler, N M; Collier, R J* (2005) Towards a new form of national impedance standard for millimetre wavelengths using dielectric waveguide. In: BEMC 2005 - British Electromagnetic Measurements Conference, 14-17 November 2005, NPL, UK.

Yip, J G M; Lee, M-H J*; Ridler, N M; Collier, R J* (2005) The measurement of the characteristic impedance of transmission lines using nanoscale resistive films. In: 65th ARFTG Conference, 17 June 2005, Long Beach, CA, USA.

Morgan, A G; Instone, I C*; Ridler, N M; Thompson, R P (2004) Comparing Internet-enabled VNA measurements with primary national standards. In: 63rd ARFTG Conference Digest, 11 June 2004, Fort Worth, TX, USA.

Ridler, N M (2002) Evaluating and expressing uncertainty in complex S-parameter measurements. In: ARFTG/NIST Measurements Short Course on Microwave Measurements and Instrumentation, 3-4 December 2002, Washington D.C, USA.

Ridler, N M; Morgan, A G; Salter, M J (2002) Generalised adaptive calibration schemes for RF network analysers based on minimising the uncertainty of measurement. In: 60th Automatic Radio Frequency Techniques Group (ARFTG) Conference, 5-6 December 2002, Washington, DC, USA.

Morgan, A G; Ridler, N M; Salter, M J (2002) Generalized 'adaptive' calibration schemes for VNA's. In: Automated RF and Microwave Measurements Society (ARMMS) Meeting Proceedings Digest, 22-23 April 2002, Corby, Northamptonshire.

Morgan, A G; Ridler, N M; Salter, M J (2002) Generalized calibration schemes for precision RF vector network analyser measurements. In: 19th IEEE Instrumentation and Measurement Technology Conference Proceedings, May 2002, Anchorage, USA.

Ridler, N M (2002) News in RF impedance measurement. In: XXVIIth General Assembly of the International Union of Radio Science (URSI), 17-24 August 2002, The Netherlands.

Dudley, R A; Morgan, A G; Ridler, N M (2002) iPIMMS - an Internet-based calibration and measurement service for vector network analysis. In: Automated RF and Microwave Measurements Society (ARMMS) Meeting - Conference Digest, 22-23 April 2002, Corby, Northamptonshire, UK.

Dudley, R A; Morgan, A G; Ridler, N M (2001) Advances in NPL's Internet calibration and measurement services for high-frequency electrical quantities. In: BEMC 2001- 10th British Electromagnetic Measurement Conference, 6-8 November 2001, Harrogate, UK.

Ridler, N M (2001) Evaluating and expressing uncertainty in complex S-parameter measurements. In: ARFTG/NIST Measurements Short Course on RF Measurements for Wireless World, 27-28 November 2001, San Diego, CA, USA.

Dudley, R A; Ridler, N M (2001) Internet calibration direct to national measurement standards for automatic network analysers. In: IMTC 2001 - 18th IEEE Instrumentation and Measurement Technology Conference, 21-23 May 2001, Budapest, Hungary.

Dudley, R A; Morgan, A G; Ridler, N M; Stevens, M J; Nesbitt, L*; Plummer, N J*; Scott, H J*; Smyth, S D*; Wylie, S* (2001) Maintaining an internet calibration facility: experiences gained from the first six months of operation. In: NCSL International Workshop and Symposium 2001, 29 July - 2 August 2001, Washington D.C, USA.

Ridler, N M; Salter, M J (2001) Propagating S-parameter uncertainties to other measurement quantities. In: 58th Automatic RF Techniques Group (ARFTG) Conference, 29-30 November 2001, San Diego, USA.

Cox, M G; Dainton, M P; Ridler, N M (2001) An interpolation scheme for precision reflection coefficient measurements at intermediate frequencies. Part 1: theoretical development. In: IMTC 2001 - 18th IEEE Instrumentation and Measurement Technology Conference, 21-23 May 2001, Budapest, Hungary.

Ridler, N M; Salter, M J; Young, P R (2001) An interpolation scheme for precision reflection coefficient measurements at intermediate frequencies. Part 2: practical implementation. In: IMTC 2001 - Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, 21-23 May 2001, Budapest, Hungary.

Ridler, N M (2000) Comparison of complex scattering coefficient measurements of a microwave step attenuator. In: Conference on Precision Electromagnetic Measurements (CPEM) Digest, 14-19 May 2000, Sydney, Australia.

Ridler, N M; Salter, M J (2000) Evaluating and expressing uncertainty in complex S-parameter measurements. In: 56th Automatic RF Techniques Group (ARFTG) Conference, 30 November -1 December 2000, Boulder, Colorado, USA.

Dudley, R A; Ridler, N M; Williams, J M (2000) Internet-based calibrations of electrical quantities at the UK's National Physical Laboratory. In: National Conference of Standards Laboratories (NCSL) Workshop and Symposium, 16-20 July 2000, Toronto, Canada.

Salter, M J; Ridler, N M; Stewart, J N* (2000) Using data visualisation techniques to explore the random error distribution of two-port VNA measurements. In: 31st Automated RF and Microwave Measurements Society (ARMMS) Conference, 22-23 May 2000, Dudley.

Cox, M G; Dainton, M P; Harris, P M; Ridler, N M; Young, P R (2000) A generalised treatment of the calibration and measurement for vector-indicating microwave reflectometers. In: Conference on Precision Electromagnetic Measurements (CPEM) Digest, 14-19 May 2000, Sydney, Australia.

Ridler, N M (1999) ANAMET comparison of complex scattering coefficients measurements of microwave adaptors. In: IMTC/99. Proc. 16th IEEE Instrumentation and Measuring Technology Conference, 24-26 May 1999, Venice, Italy.

Ridler, N M; Young, P R (1999) Investigating the random error distribution of vector network analyser measurements. In: 29th Automated RF and Microwave Measurements Society (ARRMS) Conference, 22-23 April 1999, Bracknell, UK.

Ridler, N M; Graham, C (1999) Some typical values for the residual error terms of a calibrated vector automatic network analyser (ANA). In: BEMC 99 - 9th International Conference on Electromagnetic Measurement, November 1999, Brighton, UK.

Cox, M G; Dainton, M; Harris, P M; Ridler, N M (1999) The evaluation of uncertainties in the analysis of calibration data. In: IMTC '99. Proc. 16th IEEE Instrumentation and Measurement Technology Conference, 24-26 May 1999, Venice, Italy.

Ridler, N M; Young, P R (1998) Towards traceability to UK national standards for complex reflection coefficient parameters at lower RF2. In: 27th Automated RF and Microwave Measurements Society (ARMMS) Conference, 25-26 April 1998.

Cox, M G; Dainton, M P; Harris, P M; Ridler, N M; Young P R (1998) A generalised treatment of the uncertainty in calibration and measurement for vector-indicating microwave reflectometers. In: 2nd International Workshop on Advanced Mathematical Methods in Measurement and Instrumentation, 8-10 July 1998, Villa Olmo, Como, Italy.

Ridler, N M (1997) ANAMET - Past, Present and Future. In: Proc. 26th ARMMS Conference, 7-8 April 1997, The Abbey Hotel, Malvern.

Ridler, N M (1996) ANAMET - a progress report. In: 24th Automated RF Microwave and Measurements Society (ARMMS) Conference, April 1996, Windermere, Cumbria, UK.

Ridler, N M; Medley, J C (1996) ANAMET comparison of reflection coefficient measurements at RF. In: Proc. 25th ARMMS Conference, 31 October - 1 November 1996, Bath.

Medley, J C; Ridler, N M (1996) Analysing multidimensional measurement comparison data containing occasional erratic points. In: 1996 Conference on Precision Electromagnetic Measurements (CPEM), 17 - 21 June 1996, Braunschweig, Germany.

Ridler, N M; Medley, J C (1996) Comparison of ANA s-parameter measurements in X-band waveguide. In: 24th Automated RF and Microwave Measurements Society (ARMMS) Conference, April 1996, Windermere, Cumbria, UK.

Medley, J C; Ridler, N M (1996) Data analysis game. In: 25th Automated RF and Microwave Measurements Society (ARMMS) Conference, 31 October - 1 November 1996.

Ridler, N M; Medley, J C (1996) A comparison of microwave reflection and transmission measurements in rectangular waveguide. In: Advances in metrology and its role in quality improvement and global trade, Narosa Publishing House, February 1996, New Delhi.

Ridler, N M (1995) Analysing data - by means and no means. In: 23rd Automated RF and Microwave Measurements Society (ARMMS) Conference, September 1995, Windermere, Cumbria, UK.

Ridler, N M (1995) Discarding the mean - an alternative way of analysing data. In: BEMC 95 7th British Electromagnetic Measurements Conference Digest, 6 - 9 November 1995, Malvern.

Ridler, N M; Medley, J C (1995) Recent improvements to the traceability of APC-7 impedance measurements at lower RF in the UK. In: BEMC 95 7th British Electromagnetic Measurements Conference Digest, 6 - 9 November 1995, Malvern.

Ridler, N M (1995) Uncertainties tutorial. In: 7th IEE Vacation School on Microwave Measurements, 21-26 May 1995, Malvern, UK.

Smith, F C*; Ridler, N M (1995) An assessment of the reproducibility of free wave reflection data using guided wave data as a benchmark. In: 22nd Automated RF and Microwave Measurements Society (ARMMS) Conference, March 1995, Windermere, Cumbria.

Jones, G D; Ridler, N M (1994) ANAMET comparison of type-N VSWR measurements. In: 20th Automated RF and Microwave Measurements Society ARMMS Conference, 28-29 March 1994, Nottingham, UK.

Ridler, N M; Medley, J C (1994) Calibration technique using new calculable standard for RF reflectometers fitted with GPC-7 connectors. In: Conference Digest on Precision Electromagnetic Measurements (CPEM), 27 June - 1 July 1994, Boulder, Colorado, USA.

Ridler, N M (1994) Evaluating and expressing uncertainty in measurement. In: COPEL Training Centre Seminar, June 1994, Curitiba, Brazil.

Ridler, N M; Medley, J C (1994) New calculable standards for reflectometers in 7 mm coaxial line. In: 21st Automated RF and Microwave Measurements Society (ARMMS) Conference, September 1994, University of Surrey.

Ridler, N M (1993) Evaluating the six-port reduction process using a method of statistical trials. In: 6th British Electromagnetic Measurements Conference Digest (BEMC 93), 2-4 November 1993, NPL, Teddington, UK.

Ridler, N M (1993) General principles for evaluating and expressing uncertainty in measurement. In: 6th British Electromagnetic Measurements Conference Digest (BEMC 93), 2-4 November 1993, NPL, Teddington, UK.

Ridler, N M; Medley, J C (1993) Traceable measurements in coaxial line on an HP8510C network analyser. In: 18th Automated RF and Microwave Measurements Society (ARMMS) Conference, April 1993, University of Manchester Institute of Science and Technology (UMIST).

Ridler, N M (1993) VHF impedance. In: 6th IEE Vacation School on Microwave Measurements, 2-7 May 1993, Malvern, UK.

Ridler, N M; Medley, J C (1993) A new calibration technique for reflectometers at RF in 7mm coaxial line. In: 6th British Electromagnetic Measurements Conference Digest (BEMC 93), 2-4 November 1993, NPL, Teddington, UK.