Clarke, R G; Shang, X; Ridler, N M; Lozar, R; Probst, T; Arz, U (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.
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Official URL: https://doi.org/10.1109/ARFTG47584.2020.9071783
Item Type: | Conference or Workshop Item (Paper) |
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Subjects: | Electromagnetics > RF and Microwave |
Divisions: | Electromagnetic & Electrochemical Technologies |
Identification number/DOI: | 10.1109/ARFTG47584.2020.9071783 |
Last Modified: | 12 Nov 2020 11:22 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/8970 |
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