Votsi, H*; Roch-Jeune, I*; Haddadi, K*; Li, C*; Dambrine, G*; Aaen, P H*; Ridler, N M (2016) Development of a reference wafer for on-wafer testing of extreme impedance devices. In: 88th ARFTG Microwave Measurement Conference (ARFTG), 8-9 December 2016, Austin, Tx, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Identification number/DOI: | 10.1109/ARFTG.2016.7839719 |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7525 |
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