Yip, J G M; Lee, M-H J*; Ridler, N M; Collier, R J* (2005) The measurement of the characteristic impedance of transmission lines using nanoscale resistive films. In: 65th ARFTG Conference, 17 June 2005, Long Beach, CA, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Keywords: | thin films, waveguides, microwaves, millimeter-waves |
Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3302 |
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