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The measurement of the characteristic impedance of transmission lines using nanoscale resistive films.

Yip, J G M; Lee, M-H J*; Ridler, N M; Collier, R J* (2005) The measurement of the characteristic impedance of transmission lines using nanoscale resistive films. In: 65th ARFTG Conference, 17 June 2005, Long Beach, CA, USA.

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Abstract

No abstract available

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: thin films, waveguides, microwaves, millimeter-waves
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3302

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