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The trace is on measurements: developing traceability for S-parameter measurements at millimeter and submillimeter wavelengths.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2013) The trace is on measurements: developing traceability for S-parameter measurements at millimeter and submillimeter wavelengths. IEEE Microw. Mag., 14 (7). pp. 67-74.

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Abstract

In recent years, there has been a growing interest in the use of frequencies in the higher millimeter-wave and lower submillimeter-wave regions (i.e. typically, from 100 GHz to 1 THz, or thereabouts). This is being driven, for example, by new developments in electronics that are opening up this area of the electromagnetic spectrum for new end-user applications (e.g. related to THz electronics [1], communications [2] and other areas [3]).

Item Type: Article
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Identification number/DOI: 10.1109/MMM.2013.2280311
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/6050

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